in2quality of ferrous steel-coatings 01
TRANSCRIPT
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Rev. 110214-1 D-MATERIALS: IRON + STEEL
Layers, surfaces + wal ls measure s afe
TSL measurement solutions for IRON, STEEL + STAINLESS STEEL
Type of Materials
- Diffusion and surface layers, thin / thick layers / walls /Duplex-u. Multi Layer
Background measurements, Measurement /Solution Requirements about ...
- Influence of coating on the material properties: Optical / electrical /mechanical / chemical / thermal / porosity
- Solgel, Electrochemical coating, thermal spraying, PVD / CVDPhosphating.
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APPLICATION TSL-favored SYSTEMSLAYER THICKNESS, MT/QS/US/QW/EL/DF/AU/FI/US/FH1
DUPLEX THICKNESS MT / FI / EL / AU + DFTHIN PCI / delta / GAMATERIAL THICKNESS MT/QS/US/QW/EL/DF/AU/FI/US/FH1SURFACE .- roughness / TOPOGRAPHY / PORE PCI / SU / PCT / TH / TY / FI / POColor, luster, cleanliness / PURITY delta / PG / CC / PCI
SPECIAL APPLICATIONSRADII, INTERNAL PIPE, SMALL AREAS MT / EL / DF / AU / FI / PCI / FH
STAINLESS STEEL + AUSTENIT MT / EL / DF / AU / QS / FH
LayerMaterialsPAINT / PAINT + ENAMEL / CERAMICother organic THICK QA / MT / DF / EL / AU / FI / RA / delta / PCI / CCSZINC / galv.NICKEL QA / MT / DF / EL / AU / FI / RA / GA
Order process MT / QA / QW / EL / DF / AU / FI / PCI / delta
OrdereProcess,specifically Plating STAINLESS STEEL, PHOSPHATE. MT / DF / QS / FH / MT / DF / EL / AU /POWDER SOLGEL, THERM.SPRITZEN, PVD, CVD QA / RA / EL / alpha / delta / PCI / CCSBASE-COAT PROCESS alpha + el.TAUCH
ONLINE MEASUREMENTIt should be noted that most solutions as online versions, and more extensively for the8-hour operation to date as budget systems are available.
.
Please choose in the google video mode, the corresponding measurement applications
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NAVIGATION NOTE
Dear reader of our Representations,
- in order to effectively and accurately find your desired Task Stellungn by TSLSolving strategies and systems please use the following 5 Choice of topic buttons,if you are :
- >starting from Your material to be measured at Material -> MATERIAL- >or Your Application starting -> -> APPLICATION- >or the already knownn Procedure -> -> SYSTEMS- >or if you apply for a Commercial unit Interest -> -> SHOP- >content / editorial Backgrounds- And on -> -> SUPPORT
our problem-solving opportunities, Engineeringand want to inform R & D.
We give up the search word input, the experience shows very often user Expectations not responded.
They are therefore our opportunities for your measuring task by image-navigation after the 3-th level.
By Press Your right Choice of topics-Key to move from the 1st -,in the 2nd level where youto your Target . Approach From the 2. Level navigate by Image keyingUntil you are in der 4. Level
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From the very start - working principle of the most common measuring method
Non-destructive coating thickness measurement, SDM, on metals
Non-destructive measurement of wall thicknesses, WDM, metals
For the most widely used measurement application procedures are established that define the two effects from the use of a sensorover a metallic base material (GW) as a carrier of the layer to be measured.
Each mechanisch/magnetische- or inductive force between a sending and a receiving sensor is a metal as a carrier of the layer
affected by the distance to be measured (= layer thickness).
The thicker the layer, the smaller the sensor effect can be evaluated. Distance measurement between sensors and the respectivebase material as a reference.
This base material (or substrate, or backing material) therefore first determined that, in some cases to use measurement processes.
The layer to be measured is defined the distance to the substrate, where it in alloys Interactions with the substrate may.
As a sensor of a measuring unit, these technologies are encapsulated in the different measuring probes almost allmanufacturers and measurement principles of portable devices.
Nearly all issues of induction SDM resulting from the ratio of the injected primary to secondary measurable / measuredenergy.
The focus will thus binding the magnetic transmission properties of the base metal. Here, almost all potential for conflictand solution strategies are later
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Magnetic-inductive measuring method
ApplicationSDM of non-magnetic layers on FE substrates. WDM non-magnetic materials to reference-FE.
- Also suitable building sites, measuring time: usually faster than 5 seconds.Each suitability for conductive thick films (galvanizing) to consider!
System cost-EUR: 400
Training needs: 5
Measuring time: 5 sec betterPreparation / set-up time: 5 minPrerequisites: Electric-magnetic alignment at the (same) uncoated object using standards.
For magnetizable metal substrates with non-magnetizable coatings.Substrate thickness: 0.5-1mm minimal, depending on the sensor.
The coating must be tough enough to be the pressure of each patch test probe tip to yield.
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Eddy current measuring method
Device Type: Optical almost identical to the inductive method is the only high-frequency coil of the probe usually horizontally, whichthe measurement area determines effect.
SDM of electrically non-conductive layers on highly conductive substrates. WDM non-conductive materials to reference ladder - theresignificant advantages over ultrasound systems at very high accuracy.
Suitable for non-conductive thick films and materials (fiberglass, etc.).
Requirements: Electrical adjustment on the uncoated object using standards.
also suitable building sites,
System Cost: 400
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Training Needs: 4
Measuring time: 10 sec
Preparation / set-up time: 1 min.
Requirements: Electrical adjustment on the uncoated object using standards.Substrate thickness: approx 40m minimal.
For non-magnetic metal substrates with non-conductive coatings.
The coating must be tough enough to resist the pressure of each patchMeasurement probe tip is not to yield.
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Hall probes Procedure
SDM / WDM non-magnetic layers on FE substrates. WDM non-magnetic materials to reference-FE(Also as a ball), - a ball serves as Referenzpol - significant safety advantages over eg. Ultrasound systems at very high accuracy andsignificant radius capability.
Requirements: Electric-magnetic alignment on the uncoated object using standards.
Suitable building sites, especially near stream areas .- often for thin substrates - rolling
Measuring time: 5 seconds
System Cost: beginning EUR 700
Training Needs: 4
Measuring time: 1-10 sec
Preparation / set-up time: 1 min.
For magnetizable metal substrates with non-magnetizable coatings.
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The coating must be tough enough to be the pressure of each patch test probe tip to yield.
Technology Hall does not require acoustic impedance-dependent adjustments of the wall-materialProperties compared with ultrasonic techniques (US-WDM) with changing metrics andGeometries. It also eliminates the coupling fluid.
The wall thickness may be only a few micrometers (microns) of millimeters to centimeters.
Magnetic Static-Methode
Application
SDM / WDM by non-magnetic layers (regions) FE-substrates. WDM non-magnetic materials to FE. Even for soft Schhicht / wall
materials.
- Also suitable building site
System Cost: from 100
Training required: 2
Measuring time: 10 sec
Preparation / set-up time: 30 sec
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Requirements: No adjustment, therefore, close application limits.Substrate thickness note (about 1 mm minimum)!
For magnetizable metal substrates with non-magnetizable coatings.
The coating does not have to be hard enough to not have the pressure of each patch test probe tip to give, sinceMeasurement of release of the pressure goes to zero. Wiche materials such as rubber, are so often measured.
Examples of industrially used systems + technology
NAVIGATION within the TSL kathegorisierten materials / methods described in the direction of measurement systemdistribution
in each case above TSL-operated working area. Other operations are u.U. very different.
Some commercial areas require individual user information, so we ask you for your request-> aA
Ratings are the first orientation, of course, subject to individual review andif profitability analysis. Points 7, 9, 10 and 11, we respond to the knowledge of concrete
Questions individually -> a.A.
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APPLICATION/ Measurement of TSL-SYSTEMSLAYER THICKNESS, MATERIAL THICKNESS MT/FH1QS/EL/DF/AU/FI/US/FH7/delta
u-tube> Video mode: Applications
- Largely current EU standard.
- Built in or external probes.- External probes often in the system 2 to about 20 000m- Data transfer and / or internal statistics,- Internal memory for data series (batches) and / or memory for spec. Adjustment settings (applications).- Equipment portable / stationary, by radio, infrared, or via interface multiplexing / Mux.- Accessory sets, tripod / handling, roll-additives, Mux, data, radio ... BUTTON> Systems> Hand Measuring-> Options- Measurement and transferPrograms for every need, BUTTON> Systems> hand-held> Options + programs
TSL-TYPE USE PRINCIPLE OF MEASUREMENT TOLERANCE RANGE ALPHA DATA FAILURE RISK KNOWLEDGE InPlace. COSTS PREV
OP 01 02 03 MT Series 04 05 06 07 08 09 10 11
SDM / WDM MT IND / WI 2-10 000 2 / / 1-3 - 8 AA 10 / 5 aA aA aA
TSL-TYPE USE PRINCIPLE OF MEASUREMENT TOLERANCE RANGE ALPHA DATA FAILURE RISK KNOWLEDGE Amort. COSTS PREV
OP 01 02 03 MT 700 Series 04 05 06 07 08 09 10 11
SDM / WDM MT IND / WI 4-10 000 3 / / 1-3 - 2 aA 10 / 5 a.a a.a a.A.
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TSL-TYPE USE PRINCIPLE OF MEASUREMENT TOLERANCE RANGE ALPHA DATA FAILURE RISK KNOWLEDGE Amort. COSTS PREV
OP 01 02 03 Sensors 04 05 06 07 08 09 10 11
SDM / WDM MT IND / WI 2-800 000 1 / / 1-5 4 - aA 10 / 6 a.a a.a a.A.
TSL-TYPE USE PRINCIPLE OF MEASUREMENT TOLERANCE RANGE ALPHA DATA FAILURE RISK KNOWLEDGE Amort. COSTS PREV
OP 01 02 03 FH 1 Series 04 05 06 07 08 09 10 11
SDM / WDM FH1 BONDING force 5-20 000 3 / / 3-10 5 / 10 - aA 6 / 1 a.a a.a a.A.
A representative type-section of our extensive product range, -- According to fitness, we offer you the system or even more suitable for your needs.
TSL-TYPE USE PRINCIPLE OF MEASUREMENT TOLERANCE RANGE ALPHA DATA FAIL-RISIKO KNOWLEDGE Amort. COSTS PREV
OP 01 02 03 FH 7 Series 04 05 06 07 08 09 10 11
SDM / WDM FH7 HALL 20-18 000 3 / / 2-3 10 10 aA 5 / 2 a.a a.a a.A.
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TSL-TYPE USE PRINCIPLE OF MEASUREMENT TOLERANCE RANGE ALPHA DATA FAILURE RISK KNOWLEDGE Amort. COSTS PREV
OP 01 02 03 GA Series 04 05 06 07 08 09 10 11
SDM GA coulommetr. 0.2 0.3 8 2 20 / 150 aA 10 / 7 a.a a.a a.A.
TSL-TYPE USE PRINCIPLE OF MEASUREMENT TOLERANCE RANGE ALPHA DATA FAILURE RISK KNOWLEDGE Amort. COSTS PREV
OP 01 02 03 Alpha Series 04 05 06 07 08 09 10 11
SDM alpha el-static 0.2-50 3 0.1 10 10 aA 5 / 2 a.a a.a a.A.
TSL-TYPE USE PRINCIPLE OF MEASUREMENT TOLERANCE RANGE ALPHA DATA FAILURE RISK KNOWLEDGE Amort. COSTS PREVOP 01 02 03 Delta Series 04 05 06 07 08 09 10 11
SDM / WDM delta white light 0.02-30/4000 0.01 10 10 2 6 / 2 aA aA 5th
TSL-TYPE USE PRINCIPLE OF MEASUREMENT TOLERANCE RANGE ALPHA DATA FAILURE RISK KNOWLEDGE Amort. COSTS PREV
OP 01 02 03 PCI Series 04 05 06 07 08 09 10 11
SDM / WD PCI white light 1-90/14000 0.01/0.1 10 10 2 6 / 2 aA aA 10
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OP 01 02 03 RA Series 04 05 06 07 08 09 10 11
SDM RA XRF 0.2-20 0.1 5 10 aA 10 / 2 a.a a.a a.A. a.a
TSL-TYPE USE PRINCIPLE OF MEASUREMENT TOLERANCE RANGE ALPHA DATA FAILURE RISK KNOWLEDGE Amort. COSTS PREV
OP 01 02 03 SU Series 04 05 06 07 08 09 10 11
Roughness SU button 0.02-160 5-10 1 3 5 10 / 3 aA aA 4
TSL-TYPE USE PRINCIPLE OF MEASUREMENT TOLERANCE RANGE ALPHA DATA FAILURE RISK KNOWLEDGE Amort. COSTS PREV
OP 01 02 03 PG Series 04 05 06 07 08 09 10 11
GLOSS SU button 0.02-160 5-10 1 3 5 10 / 3 aA aA 4
TSL-TYPE USE PRINCIPLE OF MEASUREMENT TOLERANCE RANGE ALPHA DATA FAILURE RISK KNOWLEDGE Amort. COSTS PREV
OP 01 02 03 PCT Series 04 05 06 07 08 09 10 11
TOPOGRAPHY PCT white light 1-90/14000 0.01/0.1 10 10 2 10 / 6 aA aA aA
TSL-TYPE USE PRINCIPLE OF MEASUREMENT TOLERANCE RANGE ALPHA DATA FAILURE RISK KNOWLEDGE Amort. COSTS PREV
TSL-TYPE USE PRINCIPLE OF MEASUREMENT TOLERANCE RANGE ALPHA DATA FAILURE RISK KNOWLEDGE Amort. COSTS PREV
OP 01 02 03 PO Series 04 05 06 07 08 09 10 11
PORE TEST PO el-static 50-11000 ---- 10 - 1 7 / 3 AA AA AA
TSL-TYPE USE PRINCIPLE OF MEASUREMENT TOLERANCE RANGE ALPHA DATA FAILURE RISK KNOWLEDGE Amort. COSTS PREV
OP 01 02 03 MI Series 04 05 06 07 08 09 10 11
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SDM / WDM PO pulse radar 10 000 10 10 10 3 10 10/10 aA aA
TSL-TYPE USE PRINCIPLE OF MEASUREMENT TOLERANCE RANGE ALPHA DATA FAILURE RISK KNOWLEDGE Amort. COSTS PREV
OP 01 02 03 PT Series 04 05 06 07 08 09 10 11
SDMpulver / wet PT Photo-Thermic 6-25 10.5 10 10 2 10 / 2 aA aA 10
TSL-TYPE USE PRINCIPLE OF MEASUREMENT TOLERANCE RANGE ALPHA DATA FAILURE RISK KNOWLEDGE Amort. COSTS PREV
OP 01 02 03 MF Series 04 05 06 07 08 09 10 11
DEEP DEFECTS -waves visually AB10 000 10 10 2 10/10 10 aA aA
TSL-TYPE USE PRINCIPLE OF MEASUREMENT TOLERANCE RANGE ALPHA DATA FAILURE RISK KNOWLEDGE Amort. COSTS PREV
OP 01 02 03 STR Series 04 05 06 07 08 09 10 11
SDM / WDM STR WI 5000-800 000 5 10 6 3 5 / 2 AA AA 5
TSL-TYPE USE PRINCIPLE OF MEASUREMENT TOLERANCE RANGE ALPHA DATA FAILURE RISK KNOWLEDGE Amort. COSTS PREV
OP 01 02 03 CC Series 04 05 06 07 08 09 10 11
COLORIMETRY WI CC 5000-800 000 5 10 6 3 5 / 2 AA AA 5
TSL-TYPE USE PRINCIPLE OF MEASUREMENT TOLERANCE RANGE ALPHA DATA FAILURE RISK KNOWLEDGE Amort. COSTS PREV
OP 01 02 03 OLxz Series 04 05 06 07 08 09 10 11
ONLINE OLyz IND / WI / WLI 20-8000 0.1 / 1 10 10 1 10 / 1 AA AA 10
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TSL-TYPE USE PRINCIPLE OF MEASUREMENT TOLERANCE RANGE ALPHA DATA FAILURE RISK KNOWLEDGE Amort. COSTS PREV
OP 01 02 03 STR Series 04 05 06 07 08 09 10 11
COLORIMETRY CN WI 2400-6000 K 5 10 6 3 5 / 2 AA AA 5contact
TSL-TYPE USE PRINCIPLE OF MEASUREMENT TOLERANCE RANGE ALPHA DATA FAILURE RISK KNOWLEDGE Amort. COSTS PREV
OP 01 02 OLxyz Series 04 05 06 07 08 09 10 11
ONLINE OLxyz IND / WI / WLI 1-12 000 0.1 / 1 10 10 1 10 / 1 aA aA 10contact
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Special application forms on the SDM FE grades
Hard chrome on FE Paint / powder FE Organic layers on FE Non-ferrous metals on FE Hot dip galvanizing and duplex Zinc-nickel
Note: For shares in magnetizable-layer structures (zinc / nickel, - SDM elements with nickel-units), the suitabilitypossibly via micrograph check and correct. On methodological differences and stable processes suitable to use anautomatic curve-correction program, such as TSLconvert.
To it, for example, is for highway pavement thickness accounts of this process, a regulatory basis of calculation and shall be trainedaccordingly.
Nmaybe-conducting materials to a simple aluminum foil as a loadable Reference
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Pavement thicknesses Wood thickness FRP thickness
Glass thickness
Tag
Oops! In the SD measurement used terms that can confuse:
Calibration a measuring instrument: Repatriation on a national / international depositedStandard mass and timed De DocumentationsTarget-state durch a Calibration with certificate and seal.
Adjustment/ Setting the meter: Electrical preparation and adjustment of the instrumentfor the current Messaufgabe.durch the user by means of zero and any film standard.
The Adjustment is often Manuals in more than >Calibration, 'Or' calibration KAL microns?
At this point to emphasize that according to DIN EN ISO throughout the issue is not the Greek term (micron), but bindingof the metrological term
microns,Micrometer, Is utilized.
1 m 1 x 10-6 M 1: 1000 000 meters 0, 000 001Meter 0,001 mm
1mm 1 x 10-3 M 1 Meter: 1000 1000 microns
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Serial measurements of very thin layers with the possibility of very thin substrates- The capacitive SDM process
Application
Capacitive SDM method for thin films on thin metal sheets andReference conductive films, the material thickness from 1 micron is hardly relevant.
Training needs: 3
Measuring time: 10 sec
Preparation / set-up time: 1 min.
Suitable for reference measurements with films - such as: offset printing.AB 2007 is the Procedure for Automotive Basecoat tested, here by the usual measurement errorMagnetization fluctuations in thin FE-substrate are no longer significant, -
A unique feature!
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to discuss current measuring method
Polychromatic interferometry for rough surfaces + topography
Application topography measurement
Photothermal method for heavily pigmented layers, powderwet paint and non contact.
System cost: EUR 25 000 from sensors
Training Needs: 4
Measuring time: from 2 sec
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Preparation / set-up time: a few min.
Impuls-Radar/Mikrowellen measurement methodApplication
- For roads / Thick layers / layer composite,System Cost: sensors from about EUR 100 000
Training needs: 5
Measuring time: 0.1 seconds
Preparation / setup time: minimum 10 min.
SDM ultrasonic methodApplication
- Even for films on organic substrates and multilayers.
System Cost System from EUR 3500
Training needs: 5
Measuring time: 10 sec
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Preparation / set-up time: 5 min.
The matching process
The conditions in industrial production environments demand meters, which operate quickly and reliably, and when usedon site are mains-independent, weather-resistant and temperature-independent. In addition, the required margin ofmeasurement uncertainty is taken into account as it is to read from the device manufacturer.
Noteworthy are the representations and conditions under which a supplier / manufacturer's instructions for instrumentcharacteristics are achievable - even ours. A transparency of the different modes of representation, particularly in relationto the requested application solution towards us is essential, as we design solutions with the matching, so different
systems. Here was a procurement (unfortunately due to the increasing pressure of a different order) does not take place inhaste.
The appropriate adjustment and fixation-related applications are also used.Measuring equipment plus TSL-precision
stand
With a plurality of measuring devices affect conductivity / Magnetic properties of the measured wall / coating such as zinc
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or nickel, the selected measuring method for the user or subtly evident. This should already give independent advice tocommon problems and find out beforehand.
- Helpful Links to standards and regulations
DIN 50976 Hot dip galvanizing of components (hot dip galvanizing); requirementsand testing,
DIN EN ISO 1461 (draft) hot-dip galvanizing of individual pieces
DIN EN ISO 2064 / DIN 50 928 for replacement-1Metallic and other organic layers, definitions andProvisions relating to the measurement of film thickness: 1987-08)
DIN EN ISO 2178 /Replacement for DIN 50 981: 1979-05)
Non-magnetic coatings on magnetic substrates;Measurement of coating thickness, Magnetverfah, Ren
DIN EN ISO 2360 /Replacement for DIN 50 984: 1978-08
Non-conductive coatings on non-magnetic substrates;Measurement of coating thickness, eddy currentprocess
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DIN 1319-1 Fundamentals of Metrology, Basic concepts,
Quality System-Directive FORD Q-101 or the manuals of the German Society for Quality (DGQ) as a further indication for thecalculation of control limits.
DIN 1319-2 Foundations of measurement; definitions for the application ofGauges
DIN 1319-3 Foundations of measurement; evaluation of measurementsA single measure, measurement uncertainty
DIN EN ISO 2808Paints and varnishes-Determination of film thickness
includes: DIN 50 981, DIN 50 984, ISO 2178, 2360, 2808, BS 5411 (3,11) 3900 (c, 5) and ASTM B499, DI 400th
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NAVIGATION NOTE
Dear reader of our Representations,
- in order to effectively and accurately find your desired Task Stellungn by TSLSolving strategies and systems please use the following 5 Choice of topic buttons,if you are :
- >starting from Your material to be measured at Material -> MATERIAL- >or Your Application starting -> -> APPLICATION- >or the already knownn Procedure -> -> SYSTEMS- >or if you apply for a Commercial unit Interest -> -> SHOP- >content / editorial Backgrounds- And on -> -> SUPPORT
our problem-solving opportunities, Engineering
and want to inform R & D.
We give up the search word input, the experience shows very often user Expectations not responded.
They are therefore our opportunities for your measuring task by image-navigation after the 3-th level.
By Press Your right Choice of topics-Key to move from the 1st -,in the 2nd level where youto your Target . Approach From the 2. Level navigate by Image keyingUntil you are in der 4. Level
Phone> 0049 - (0) - 9841 - 40-1189 TV Conference> -1197
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