high temperature multi-layered alloy heater assembly and related

US006035101A

Ulllted States Patent [19] [11] Patent Number: 6,035,101 Saj0t0 et al. [45] Date of Patent: Mar. 7, 2000

[54] HIGH TEMPERATURE MULTI-LAYEREI) 5,589,224 12/1996 Tepman et a1. ....................... .. 118/725

ALLOY HEATER ASSEMBLY AND RELATED (List Continued on next page) METHODS

FOREIGN PATENT DOCUMENTS

[75] Inventors: TaleX Sajoto, San Jose; Leonid 63496033 8/1988 Japan __ H01L 21/205 selyutijla San Leandro; Jun Zha°> 63-278322 11/1988 Japan .. H01L 21/205 Cupert1no; Stefan Wol?', Sunnyvale, all 64-5012 1/1989 Japan __ H01L 21/205 Of Calif. 64-77930 3/1989 Japan .. H01L 21/205

2-27715 1/1990 Japan ......................... .. H01L 21/205

[73] Assignee; Applied Materials, Inc” Santa Clara, 3-235325 10/1991 Japan ......................... .. H01L 21/205

Calif OTHER PUBLICATIONS

Haynes International, Inc., Data Sheet for Haynes® 242TM [21] Appl' N05 09/056,703 Alloy, High—Temperature Alloys, (Sep., 1991).

- _ W.L. Mankins and S. Lamb, Properties and Selection: Non [22] Flled' Mar‘ 26’ 1998 Ferrous Alloys and Special—Purposes, Nickel and Nickel

Related US‘ Application Data Alloys, ASM Handbook, vol. 2, 429—445 (1990). Primary Examiner—Joseph Pelham

[63] Continuation-in-part of application No. 08/798,004, Feb. 12, Attorney, Agent, or Firm—ToWnsend & ToWnsend and Crew

[51] Int. Cl.7 ......................... .. C23C 16/00; H01L 21/68; [57] ABSTRACT F28F 7/00; F27B 5/14 _ _ _

[52] US. Cl. ........................ .. 392/416; 392/418; 219/390; The Present “lemon Provlde? Systems’ melhods and ma‘ ratus for heating substrates in a processing chamber to

118/728 0 . _ temperatures up to at least 700 C. In accordance With an

[58] Fleld 0f Search ................................... .. 219/390, 405, embodiment of the invention a heater assembly With an 219/411’ 391’ 402’ 409’ 464’ 465’ 467’ inner core of high thermal conductivity is encased in a shell 521> 536> 540; 392/418> 416; 118/724> of loWer thermal conductivity, creating a nearly isothermal

725’ 728; 165/61’ 802; 373/127; 432/152; interface betWeen the core and shell. The inner core is braZed 29/2501 to the shell, promoting thermal transfer, and acts as a thermal

short betWeen opposing surfaces of the shell. The heater [56] References Cited assembly is designed to minimize thermal stresses~arising

from the difference in the thermal expansion coefficients of

Us PATENT DOCUMENTS the various components of the multi-layered' heater assem bly. In one embodiment of the invention, tWo independently

5,059,770 10/1991 Mahawili .............................. .. 219/391 powered heating elements are arranged concentrically to 5:126:53 6/1992 Newman ct a1~ 219/540 each other to create a dual Zone heater. Athermal gap in the

232383499 8/1993 V83)“ a1‘ """ 118g?‘ inner core betWeen the inner and outer heating elements ’343’O22 8/1994 G1 elt’ Sr‘ et a‘ 219/ 2 de-couples the Zones and provides a more controllable

5,343,938 9/1994 Schmidt 165/802 t t ?l t th f f th h t . 1 d. 5,397,396 3/1995 Kosky et al. . 118/724 empera um Pro 6 a ,6 Sur, ace 0 6 ea 8r’ me“ mg 574627603 10/1995 Murakami _______ __ 118/719 excellent‘ temperature uniformity. In one embodiment, an RF 5,482,558 1/1996 Watanabe et at 118/728 isolator is placed betWeen a heater and a support shaft, 5,484,011 1/1996 Tepman et a1, __ 29/2501 alloWing the heater to be poWered as an electrode in a 5,516,367 5/1996 Lei et al. 118/725 plasma process. 5,558,717 9/1996 Zhao et a1. . 118/725 5,589,003 12/1996 Zhao et al. ............................ .. 118/728 11 Claims, 17 Drawing Sheets

A

6,035,101

US. PATENT DOCUMENTS

5,595,241 1/1997 Jelinek ................................. ..165/80.1 5,665,167 9/1997 Deguchi et a1. . 118/728 5,675,474 10/1997 Nagase et a1. ....................... .. 165/802

5,775,416 5,796,074 5,817,156 5,844,205

7/1998 Heimanson et a1. .................. .. 118/725

8/1998 Edelstein et a1. ..................... .. 219/390

10/1998 Tateyama et a1. .. .. 29/2501

12/1998 White et a1. .......................... .. 219/390

U.S. Patent Mar. 7,2000 Sheet 1 0f 17 6,035,101

6,035,101 Mar. 7, 2000 U.S. Patent

F761 l5.


. .WN 6D‘ ¥\\\\\\\\\\\\ \\\

a a an as? *1 :K

at an


8/

FIG: 2C

M. H


>FIG 5.


//// \ \\\\

/

)IS /802

825A 806

\\\\ \\\\

I

FIG: 8A.

\\\\\\\/\\\\\\\\

852/

U.S. Patent Mar. 7, 2000 Sheet 12 0f 17

833

V

FIG: 8B.

U.S. Patent Mar. 7, 2000 Sheet 14 0f 17 6,035,101

F I6.‘ 80.


I006

540.8 545.2 550.4 54 6.5 545.9

FIG: /0.


W

/ r

F n m.) y

T:

N

7

6,035,101 1

HIGH TEMPERATURE MULTI-LAYERED ALLOY HEATER ASSEMBLY AND RELATED

METHODS

CROSS REFERENCE TO RELATED APPLICATIONS

This application is a continuation-in-part of Ser. No. 08/798,004, ?led Feb. 12, 1997 entitled “Apparatus For Ceramic Pedestal and Metal Shaft Assembly” (Attorney Docket Number 16301-17940/AM1870104-P1), the com plete disclosure of Which is hereby incorporated by refer ence.

BACKGROUND OF THE INVENTION

The present invention relates to semiconductor process ing. More speci?cally, the invention relates to methods and apparatus for forming ?lms at temperatures greater than about 450° C. In some speci?c embodiments, the invention is useful for forming titanium-containing ?lms such as titanium, titanium nitride, and titanium disilicide at tempera tures of up to about 625° C. or greater using chemical vapor deposition (CVD) processes. Such ?lms may be used as patterned conductive layers, plugs betWeen conductive layers, diffusion barrier layers, adhesion layers, and as a precursor layer to silicide formation. In addition, other embodiments of the present invention may be used, for example, in physical vapor deposition (PVD) processes, to alloy substrate materials, and to anneal substrate materials. One of the primary steps in fabricating modern semicon

ductor devices is forming various layers, including dielectric layers and metal layers, on a semiconductor substrate. As is Well knoWn, these layers can be deposited by CVD or PVD processes. In a conventional thermal CVD process, reactive gases are supplied to the substrate surface Where heat induced chemical reactions (homogeneous or heterogeneous) take place to produce a desired ?lm. In a conventional plasma CVD process, a controlled plasma is formed to decompose and/or energiZe reactive species to produce the desired ?lm. In general, reaction rates in thermal and plasma processes may be controlled by controlling one or more of the folloWing: temperature, pressure, plasma density, reactant gas ?oW rate, poWer frequency, poWer levels, chamber physical geometry and others. In an exem plary PVD system, a target (a plate of the material that is to be deposited) is connected to a negative voltage supply (direct current (DC) or radio frequency While a substrate holder facing the target is either grounded, ?oating, biased, heated, cooled, or some combination thereof. A gas, such as argon, is introduced into the PVD system, typically maintained at a pressure betWeen a feW millitorr (mtorr) and about 100 mtorr, to provide a medium in Which a gloW discharge can be initiated and maintained. When the gloW discharge is started, positive ions strike the target, and target atoms are removed by momentum transfer. These target atoms subsequently condense into a thin ?lm on the substrate, Which is on the substrate holder.

Semiconductor device geometries have dramatically decreased in siZe since such devices Were ?rst introduced several decades ago. Since then, integrated circuits have generally folloWed the tWo-year/half-siZe rule (often called “Moore’s LaW”) Which means that the number of devices Which Will ?t on a chip doubles every tWo years. Today’s Wafer fabrication plants are routinely producing 0.35 pm feature siZe devices, and tomorroW’s plants soon Will be producing devices having even smaller feature siZes. As device feature siZes become smaller and integration density

10

15

20

25

30

35

40

45

55

60

65

2 increases, issues not previously considered crucial by the industry are becoming of greater concern. For example, devices With increasingly high integration density have features With high (for example, greater than about 3:1 or 4:1) aspect ratios. (Aspect ratio is de?ned as the height-to spacing ratio of tWo adjacent steps.) High aspect ratio features, such as gaps, need to be adequately ?lled With a deposited layer in many applications.

Increasingly stringent requirements for processes in fab ricating these high integration devices are needed in order to produce modern devices, and conventional substrate pro cessing systems are becoming inadequate to meeting these requirements. Additionally, as device designs evolve, more advanced processing capabilities are required in substrate processing systems used to deposit ?lms made of materials needed to implement these devices. For example, the use of titanium is increasingly being incorporated into integrated circuit fabrication processes. Titanium has many desirable characteristics for use in a semiconductor device. Titanium can act as a diffusion barrier betWeen, for example, a gold bonding pad and a semiconductor, to prevent migration of one atomic species into the next. Also, titanium can be used to improve the adhesion betWeen tWo layers, such as betWeen silicon and aluminum. Further, use of titanium, Which forms titanium disilicide (silicide) When alloyed With silicon, can enable, for example, formation of ohmic con tacts. A common type of deposition system used for depos iting such a titanium ?lm is a titanium sputtering deposition system Which is often inadequate for forming devices With higher processing and manufacturing requirements. Speci?cally, titanium sputtering systems may be unable to deposit uniform conformal layers in high aspect ratio gaps because of shadoWing effects that occur With sputtering. In contrast to sputtering systems, a plasma-enhanced chemical vapor deposition (PECVD) system may be more suitable for forming a titanium ?lm on substrates With high aspect ratio gaps. As is Well knoWn, a plasma, Which is a mixture of ions and gas molecules, may be formed by applying energy, such as radio frequency (RF) energy, to a process gas in the deposition chamber under the appropriate conditions for example, chamber pressure, temperature, RF poWer, and others. The plasma reaches a threshold density to form a self-sustaining condition, knoWn as forming a gloW dis charge (often referred to as “striking” or “igniting” the plasma). This RF energy raises the energy state of molecules in the process gas and forms ionic species from the mol ecules. Both the energiZed molecules and ionic species are typically more reactive than the process gas, and hence more likely to form the desired ?lm. Advantageously, the plasma also enhances the mobility of reactive species across the surface of the substrate as the titanium ?lm forms, and results in ?lms exhibiting good gap ?lling capability.

HoWever, conventional PECVD systems Which use alu minum heaters may experience some limitations When used for certain processes, such as forming a titanium ?lm from a vapor of, for example, titanium tetrachloride (TiCl4). Aluminum corrosion, temperature limitations, unWanted deposition, and manufacturing ef?ciency are some of the problems With such conventional PECVD systems that may be used to deposit a ?lm such as titanium.

In the exemplary process, titanium tetrachloride, Which is a liquid at room temperature, and a carrier gas, such as helium, bubbled through this liquid generates vapor that can be carried to a deposition chamber. At a substrate tempera ture of about 600° C., this process deposits a layer of titanium at about 100 A/min. It is desireable to increase the deposition rate, and one Way to do this is by increasing the temperature of the substrate.

high temperature multi-layered alloy heater assembly and related

Documents