electrical and electromechanical characteristics of nanoassembled carbon nanotube thin film...
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ELECTRICAL AND ELECTROMECHANICAL CHARACTERISTICS OF NANOASSEMBLED
CARBON NANOTUBE THIN FILM RESISTORS ON FLEXIBLE SUBSTRATES
Wei Xue and Tianhong CuiDepartment of Mechanical Engineering, University of Minnesota, Minneapolis, USA
Transducers’07
Speaker: Wen-Fan Liao
ID:g946220
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Outline
Introduction Experiments Device Characteristics Conclusion References
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Introduction
This paper report the fabrication of single-walled carbon nanotube (SWNT) thin-film on plastic substrates with layer-by-layer self-assembly
assemble SWNTs on flexible substrates and explore the properties of the SWNT thin films which are built with alternating layers of SWNTs and PDDA
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Experiments
Layer-by-layer self-assembly of polyelectrolytes/CNTs andpolyelectrolytes/nanoparticles
Ref : T Cui and W Xue, “Assembling three-dimensional carbon nanotube-based cantilever arrays,” SPIE Newsroom 2007
naonoparticles
Polyelectrolytes(+)
CNTs(-)
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Experiments
(a) Structure of self-assembled SWNT multilayer thin film (b) SEM image of assembled SWNTs
(PDDA/SWNT)n(PDDA/PSS)2
1μmRef : W Xue and T Cui, “Deposition and characterization of layer-by-layer nano selfassembled carbon nanotube multilayer thin films” IEEE NEMS 2007
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Experiments
Schematic structure of a SWNT thin-film resistor built on a flexible substrate
Cr/Au
Ref : W Xue and T Cui, “Deposition and characterization of layer-by-layer nano selfassembled carbon nanotube multilayer thin films” IEEE NEMS 2007
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Experiments
(a) Flexed transparency film with prepatterned electrodes (b) Transparency coated with 5 layers of SWNTs
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Experiments 4156A Precision S
emiconductor Parameter Analyzer
up to four probes Measurements inc
lude I-V curve, Id-Vg graphs, etc
Ref : http://www.ee.byu.edu/cleanroom/HP4156A.phtml
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Device Characteristics
Characteristics of SWNT thin-film resistors on flexible substrates
R10 =6.37 MΩR0 =1.35 MΩRn =(R0×R10)/[R0+(n-10) ×R10]
6.37MΩ
0.37MΩ 0.30MΩ 0.21MΩ 0.14MΩ
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Device Characteristics
Resistance versus mechanical deformation of SWNT thin-film resistors
G14 = △R14/R14 = 38.2%G16 = R△ 16/R16 = 47.1%
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Device Characteristics
Schematic models for axial deformation of SWNT on different topographies
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Conclusion
demonstrated the fabrication and characterization of SWNT multilayer thin films on flexible substrates
MEMS/NEMS devices such as pressure sensors, accelerometers, and magnetic sensors have the potential to be developed and fabricated
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References Wei Xue and Tianhong Cui, “Electrical and electromechanical characte
ristics of nano-assembled carbon nanotube thin film resistors on flexible substrates,” Transducers’07, Lyon, France, June 2007
Wei Xue and Tianhong Cui, “Deposition and characterization of layer-by-layer nano selfassembled carbon nanotube multilayer thin films,” IEEE NEMS 2007, Bangkok, Thailand, pp. 371-376, January 2007
Tianhong Cui and Wei Xue, “Assembling three-dimensional carbon nanotube-based cantilever arrays,” The International Society for Optical Engineering - SPIE Newsroom - Micro/Nano Lithography & Fabrication, http://spie.org/x17490.xml, DOI: 10.1117/2.1200710.0901, 2007
http://www.ee.byu.edu/cleanroom/HP4156A.phtml
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~Thank you for your attention~