ece 477 reliability & safety analysis
DESCRIPTION
ECE 477 Reliability & Safety Analysis. Team 5 – myATM Xue Yuan Wong. Overview. Automated Teller Machine (ATM) Use face recognition technology to verify identity 4-digit PIN Read/Write cash card via RFID Touchpad to navigate user menu Occupancy sensor to detect user. - PowerPoint PPT PresentationTRANSCRIPT
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ECE 477RELIABILITY & SAFETY ANALYSIS
Team 5 – myATM
Xue Yuan Wong
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OVERVIEW
Automated Teller Machine (ATM)
Use face recognition technology to verify identity
4-digit PIN
Read/Write cash card via RFID
Touchpad to navigate user menu
Occupancy sensor to detect user
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CRITICALITY LEVELS
High criticalityFailure that could potentially injure or harm the
user.Acceptable failure rate, λ <
Medium criticalityFailure that causes component(s) to damage and
therefore not being able to function normally anymore.
Acceptable failure rate, λ <
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CRITICALITY LEVELS
Low criticalityFailure that results non-ideal operation of the
component and does not harm the userAcceptable failure rate, λ <
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COMPONENT ANALYSIS
Microcontroller (Microchip PIC18F24J11)Complex architecturePerform various tasks (eg: sample keypad
buttons, occupancy sensor, RFID data, control modulation)
Switching regulators (TI LM2675-3.3/5.0)Handles large amount of current
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COMPONENT ANALYSIS
RFID read/write base station (Atmel U2270B)Has 16 pins. Multiple modules inside the chip.
On-chip power supply circuitAntenna driver circuitFrequency generatorSignal processing circuit
(modulation/demodulation)Fast switching signals. Generate heat easily.
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Paramaeter Description Value Comments
C1 Die complexity 0.28 16-bit MOS microprocessor
πT Temperature coefficient 0.98 Assume TJ < 85 °C
C2 Package failure rate 0.013 28 pins non-hermetic SMT component
πE Environment factor 2.0 GF (ground fixed)
πQ Quality factor 10 Commercial level
πL Learning factor 1.0 Started production in March 2011. Production > 2 years
λP Failure rate / 106 hours 3.004
1/ λP MTTF 332889 hours = 38 years
PIC18F24J11 Microcontroller
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Paramaeter Description Value Comments
C1 Die complexity 0.01 MOS linear gate with approximately 1 to 100 transistors
πT Temperature coefficient 16 Assume TJ < 100 °C
C2 Package failure rate 0.0034 8 pins non-hermetic SMT component
πE Environment factor 2.0 GF (ground fixed)
πQ Quality factor 10 Commercial level
πL Learning factor 1.0 Started production in 2004 Production > 2 years
λP Failure rate / 106 hours 1.668
1/ λP MTTF 599520 hours = 68 years
LM2675 Switching Regulator
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Paramaeter Description Value Comments
C1 Die complexity 0.01 MOS linear gate with approximately 1-100 transistors
πT Temperature coefficient 16 Assume TJ < 100 °C
C2 Package failure rate 0.0072 16 pins non-hermetic SMT component
πE Environment factor 2.0 GF (ground fixed)
πQ Quality factor 10 Commercial level
πL Learning factor 1.0 Started production in 2005 Production > 2 years
λP Failure rate / 106 hours 1.744
1/ λP MTTF 573394 hours = 65 years
U2270B RFID Read/Write Base Station
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Section A - Power Supply Block
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Section B - Microcontroller Block (1)
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Section B - Microcontroller Block (2)
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Section C – RFID Block
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FMECA CHART
Failure No.
Failure Mode
Causes Effects Method of Detection
Criticality Remarks
A1 VDD1 = 0VorVDD2 = 0V
-Failure of switching regulator-L1,L2 open-circuit or short-circuit
-No keypad input-Fail to access RFID cash card-Cannot detect user
Intel board watchdog
Low
A2 VDD1 > 5VorVDD2 > 3.3V
- Failure of switching regulator
-Partial loss of ATM functionality
Intel board watchdog
Medium
Section A – Power Supply Block
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FMECA CHART
Failure No.
Failure Mode
Causes Effects Method of Detection
Criticality
Remarks
B1 No keypad input is detected(RB1 = 0V,RB2 = 0V,RB3 = 0V)
-Keypad buttons become less sensitive
-Could not input PIN to authenticate user
By observation
Low
B2 Microcontroller UART becomes not responsive
-Failure of MAX3232-C4,C5,C6,C7 open-circuit or short-circuit
-Loss communication between microcontroller and Intel Atom Board
-Intel board watchdog-Observation
Medium
Section B – Microcontroller Block
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FMECA CHART
Failure No.
Failure Mode
Causes Effects Method of Detection
Criticality
Remarks
B3 Pin “PIR” = 0V
Potential failure of occupancy sensor
-Fail to detect user- ATM stays at inactive mode
By observation
Low
Section B – Microcontroller Block
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FMECA CHART
Failure No.
Failure Mode
Causes Effects Method of Detection
Criticality
Remarks
C1 Pin CFE continuously receives 0 or 1
-Potential failure of voltage translator (MAX3373)
- Could not control modulation-Unable to read/update cash card
By observation
Low
C2 Modulation frequency out of tolerance(f > 125 kHzorF < 125 kHz)
-R3 short-circuit or open circuit- Internal modulation circuitry issue
-Cannot detect cash card-Fail to read/update cash card
By observation
Low
Section C – RFID Block
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FMECA CHART
Failure No.
Failure Mode
Causes Effects Method of Detection
Criticality
Remarks
C3 Data rate out of tolerance(125 kHz / 32)
- Incorrect register configuration of RFID cash card- Potential failure of cash card
-Unable to read RFID cash card
By observation
Low
Section C – RFID Block
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QUESTION