digital integrated circuits...mosfet current modeling •in digital electronic circuits, we used the...
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Digital Integrated Circuits(83-313)
Lecture 11:
MOSFET ModelingSemester B, 2016-17
Lecturer: Dr. Adam Teman
TAs: Itamar Levi, Robert Giterman
18 June 2017
MOSFET Current Modeling
• In Digital Electronic Circuits, we used the Shockley Model
for hand-analysis of circuit operation.
• However, there are many models with varying levels of
accuracy to estimate the I-V curves of a MOSFET.
• In this section, we will overview several models that will
come in use throughout this course and your future.
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Lecture Content
3
Basic MOS Models
4
• The most simple MOSFET model is the Switch Model.
Switch Model
5
VGS
IDS
VT
VDS
IDS
1/Ron
The Switch Model
VGS > VT
S D
Ron
The Piece-Wise Linear Model
• As we know, when the channel pinches off,
the current saturates.
• This can be depicted with the simple
Piece-Wise Linear Switch Model
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VDS
IDS
1/Ron
IDSAT
VGT
linear saturation
The Piece-wise Linear Model
The Switch Model
Adding Channel Length Modulation
• Channel Length Modulation modeled as a finite output
resistance, causes a saturation current dependence on VDS.
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VDS
IDS
1/Ron
IDSAT
VGT
Channel
Length
Modulation
λIDSAT
-1/λ
IDSAT
1/λ
I DS
AT
D
S
VDS
IDS
The Piece-wise Linear Model
The Switch Model
Square Law (Shockley) Model
• To get a more accurate model, we already are familiar
with the Shockley or Square Law Model.
• Current is just charge times velocity, so at any point, x,
along the channel:
• We found that charge can be approximated as:
• And the velocity is the mobility times the electrical field:
8
DI x x Q x Wdx
ox GS CS TQ x C V V x V
n
dVx E x
dx
The Piece-wise Linear Model
The Switch Model
The Square Law Model
Square Law (Shockley) Model
• So we get:
• And integrating from source to drain, we get
• At pinch-off (VDS=VGS-VT), the voltage over the channel is constant, so we get:
• This is where the “Square-Law” name comes from.
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D n ox GS TI dx C W V V V dV
0 0
1
2
DSL V
DS D n ox GS T n ox DS GS T DS
WI I dx C W V V V dV C V V V V
L
2
2DSAT n ox GS T
WI C V V
L
The Piece-wise Linear Model
The Switch Model
The Square Law Model
Square Law (Shockley) Model
• Replacing VDS with VDSeff=min(VGS-VT, VDS) we get:
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2
12
DSeff
DS n ox GS T DSeff DS
VWI C V V V V
L
The Piece-wise Linear Model
The Switch Model
The Square Law Model
The Velocity Saturation Model
• However, when looking at a short channel device,
we see a linear dependence on VGS.
• This can be attributed to Velocity Saturation.
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510satm
s
The Piece-wise Linear Model
The Switch Model
The Square Law Model
The V-Sat Model
The Velocity Saturation Model
• A good approximation of the mobility curve is:
• For continuity:
• After integration, we get:
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1crit
crit
sat crit
2 satcrit
2
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n ox DSDS GS T DS
DS
crit
C VWI V V V
V LL
The Piece-wise Linear Model
The Switch Model
The Square Law Model
The V-Sat Model
The Velocity Saturation Model
• This is hard to use, but we can reach an important
conclusion.
• We found that:
• And we know that for a velocity saturated device:
• Equating, we get:
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GS T crit
DSAT
GS T crit
V V LV
V V L
2
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n ox DSDS GS T DS
DS
crit
C VWI V V V
V LL
DS ox GS DSAT T satI WC V V V
DSAT crit GT GS TV L V V V pinchoff
DSAT crit GT critV L V L vel sat
The Piece-wise Linear Model
The Switch Model
The Square Law Model
The V-Sat Model
The Unified Model for Hand Analysis
• A few simple estimations will make the V-Sat model
more user-friendly:• The mobility is piecewise linear, saturating at ξ>ξcrit/2
• VDSAT is piecewise linear, saturating at VDSAT=ξcritL/2,
when VGT>ξcritL/2
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The Piece-wise Linear Model
The Switch Model
The Square Law Model
The V-Sat Model
The Unified Model
The Unified Model for Hand Analysis
• This brings us to the Unified Model:
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2
12
DSeff
DS n ox GS T DSeff DS
VWI C V V V V
L
min , ,DSeff GS T DS DSATV V V V V
2
critDSAT
LV
2 satcrit
The Piece-wise Linear Model
The Switch Model
The Square Law Model
The V-Sat Model
The Unified Model
Advanced MOS Models
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VT* Model
• Sometimes we want to use a really simple model.
• We can assume that if the transistor is on,
it’s velocity saturated.
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*
2
2
2
T
DSATDS n GS T DSAT
DSATn GS T DSAT
V
VI k V V V
Vk V V V
*
* *
0 GS T
DS
n GS T DSAT GS T
V VI
k V V V V V
The VT* Model
The Piece-wise Linear Model
The Switch Model
The Square Law Model
The V-Sat Model
The Unified Model
The Alpha Power Law Model
• Sakurai found that by changing the exponent of the square
law, a better fit can be found with simple calculations.
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The VT* Model
The Alpha Power Law Model
The Piece-wise Linear Model
The Switch Model
The Square Law Model
The V-Sat Model
The Unified Model
2
DSAT n ox GS T
WI C V V
L
Shockley (α=2) Alpha (α=1.3)
BSIM
• The main model used by simulators today is the BSIM4
model. This model uses hundreds of parameters to
achieve a good fit.
• This model takes into
account all known
physical effects, as
well as many fitting
parameters.
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The VT* Model
The Alpha Power Law Model
BSIM
The Piece-wise Linear Model
The Switch Model
The Square Law Model
The V-Sat Model
The Unified Model
Newer Models
• BSIM Group Webpage:
http://www-device.eecs.berkeley.edu/bsim/
• Compact Model Coalition (CMC) Webpage:
https://www.si2.org/cmc_index.php
• Newer BSIM Models:• BSIM6 – Bulk CMOS
• BSIMSOI - SoI model standardized in 2001 (built on BSIM3.3)
• BSIM-CMG – multi-gate FETs (FinFet, Nanowire) – written in Verilog-A
• BSIM-IMG – Independent Multi-Gate – for UTBB-SoI
• EKV Model: http://ekv.epfl.ch/• Developed in 1995 to provide accuracy even in subthreshold
• PSP: http://psp.ewi.tudelft.nl/• Standard for current bulk CMOS
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The VT* Model
The Alpha Power Law Model
BSIM
And more…
The Piece-wise Linear Model
The Switch Model
The Square Law Model
The V-Sat Model
The Unified Model
Threshold Voltage Revisited
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Energy Band Diagrams
• To understand the threshold voltage and other secondary effects of
the MOS device, we often use energy band diagrams.
• The first approach is looking in from the gate:
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Energy Band Diagrams
• The second approach is looking from the source to the drain.
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Threshold Voltage - Basic Theory
• The basic definition of threshold voltage is
the gate voltage (VG) required to invert the channel
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0 2depOX
T MS F
ox ox
QQV
C C
2 2dep A si FQ qN
ln AF T
i
N
n
T
kT
q
Basic Theory
Body Effect
• The appearance of a voltage difference between the
source and body (VSB) is known as “The Body Effect”
• This can be modeled by the additional
charge that needs to be depleted.
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2 2dep A si F SBQ qN V
0 2 2T T F SB FV V V
2 si A
ox
q N
C
0
0 2depox
T MS F
ox ox
QQV
C C
Classic Body Effect
Basic Theory
Modern Body Effect
• A different approach is to look at
the capacitive voltage divider
between the gate and body (CGB)
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0
0
max
31 1
inv oxe GS CS T dep SB CS
dep oxeoxe GS CS T
oxe d
Q C V V V C V V
C TC V nV V n
C W
maxd
sdep
WC
Classic Body Effect
Basic Theory
Modern Body Effect
VGG
C
B
S
Coxe
Cdep
VS
VB
Modern Body Effect
• This can be shown to redefine VT as:
• In modern technologies, Cdep/Coxe is a constant,
so VT is linearly dependent on VSB!
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dep
T SB T0 SB
oxe
( )C
V V V VC
Classic Body Effect
Basic Theory
Modern Body Effect
Poly Depletion and Channel Depth
The threshold voltage is affected by two additional
factors that we have disregarded until now:
• Polysilicon Depletion• Since polysilicon is, itself, a semiconductor,
the depletion layer into the poly effectively
increases the oxide thickness.
• Channel Depth• Since the channel is not a 2-dimensional
line along the surface, the oxide thickness
is essentially increased.
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max
31 1
dep oxe
oxe d
C Tn
C W
Classic Body Effect
Basic Theory
Modern Body Effect
Hot Carrier Effects
• Electrons can get so fast that they can tunnel into
the gate oxide and increase the threshold voltage.
• This is a reliability issue as it happens over time.
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0 2depOX
T MS F
ox ox
QQV
C C
Classic Body Effect
Basic Theory
Modern Body Effect
Hot Carriers
VT Roll Off (Short Channel Effect)
• As channel length is reduced, effective channel length is
reduced by depletion regions.
• A trapezoid is created under the gate,
dividing the channel into the region
controlled by the gates and by the drain.
• In essence, VT is reduced.30
K. Goto et
al., IEDM
2003
65nm technology.
tox=1.2nm
Vdd=1V
Classic Body Effect
Basic Theory
Modern Body Effect
VT Roll-Off
Hot Carriers
DIBL (Drain Induced Barrier Lowering)
• In short channels, the barrier of
the channel is essentially lowered,
as the drain causes the energy band
to drop closer to the source.
• This is exponentially dependent on VDS.
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dT T,long DS
oxe
0.4C
V V VC
Classic Body Effect
Basic Theory
Modern Body Effect
VT Roll-Off
Hot Carriers
DIBL
Roll Off / DIBL combined
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Classic Body Effect
Basic Theory
Modern Body Effect
VT Roll-Off
Hot Carriers
DIBL
Reverse Short Channel Effect (RSCE)
• VT actually increases at channel lengths a bit higher than
minimum…
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Classic Body Effect
Basic Theory
Modern Body Effect
VT Roll-Off
Hot Carriers
DIBL
RSCE
• There are various ways to measure VT
• One classic way takes a small VDS and sweeps VGS.
• So we can find the VGS
at which the linear part
crosses Ids=0.
VDS=50mV
How to Measure VT
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2( ) 0.5d gs t ds dsI k V V V V gs tV V
VT,gm
Classic Body Effect
Basic Theory
Modern Body Effect
VT Roll-Off
Hot Carriers
DIBL
RSCE
Measuring VT
How to Measure VT
• One of the more common ways is to find the
VGS at which IDS=100 nA x W/L.
• For VT,lin, set a low VDS (VDS=50mV)
• For VT,sat set a high VDS (VDS=VDD)
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Classic Body Effect
Basic Theory
Modern Body Effect
VT Roll-Off
Hot Carriers
DIBL
RSCE
Measuring VT
OP and MP in Spectre
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Classic Body Effect
Basic Theory
Modern Body Effect
VT Roll-Off
Hot Carriers
DIBL
RSCE
Measuring VT
Further Reading
• J. Rabaey, “Digital Integrated Circuits” 2003, Chapters 2.5, 3.3-3.5
• Weste, Harris “CMOS VLSI Design”, Chapter 7
• C. Hu, “Modern Semiconductor Devices for Integrated Circuits”, 2010, Chapters 4-7
• Tzividis, et al. “Operation and Modeling of MOS Transistor”Chapters 1-5
• E. Alon, Berkeley EE-141, Lecture 9 (Fall 2009)
• M. Alam, Purdue ECE-606 – lectures 32-38 (2009) nanohub.org
• A. B. Bhattacharyya “Compact MOSFET models for VLSI design”, 2009,
• T. Sakurai, “Alpha Power-Law MOS Model” – JSSC Newsletter Oct 2004
• Managing Process Variation in Intel’s 45nm CMOS Technology, Intel Technology Journal, 2008
• Berkeley “BSIM 4.6.4 User’s Manual”
http://www-device.eecs.berkeley.edu/~bsim/BSIM4/BSIM464/BSIM464_Manual.pdf
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