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DigitalICTester(RIT)OperatorsManual

Team:17342

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CONTENTS

1. Introduction 3

2. PowerSupply 3

3. SwitchingOn 5

4. OperatingModes(executetests,sleepmode) 5

5. SelectTest 5

6. TestIC 7

7. TestResults 7

8. AddNewTests 8

9. Specifications 9

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1.Introduction

Thankyouforusingtheportable17342ICTester.ThebasicfunctionoftheICTesteristotestadigitalICforcorrectlogicalfunctioningasdescribedinthetruthtableand/orfunctiontable.TheICTesterappliesthenecessarysignalstotheinputsoftheIC,monitoringtheoutputsateachstageandcomparingthemwiththeexpectedstates.ThismodelcontainsthenecessarylibraryoftheICsforthestudentsofRIT.ItisalsocapableofaddingtestprogramsforICsnotincludedinthelibrary.2.PowerSupply

ThepowersupplysystemofthistesterconsistsoftheLi-ionbattery,theUSBchargedregulationboord,thelatchingcircuit,theTPS61072PWMboostconverterforthe5VoutputandtheTPS55340Flybackboostconverterforthe24Vlevel.Eachsubsystemhassomeimportantparametersthatwillbeneededforreplacementandregulation.

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Li-ionRechargeableBattery:

• BatteryistheSamsungICR18650-26Hcell.• Specssheetlinkis:

http://www.tme.eu/en/Document/e06617d885c58dfb3fecaf4abbe330c4/ICR18650-26H.pdf

• OfficialSpecsandDischargeCurves:http://www.candlepowerforums.com/vb/showthread.php?389665-Samsung-ICR18650-26H-2600mAh-(Pink)

• IfanewBatteryischosen,itneedstobecompatiblew/USBboard TP4056-MicroUSB5V1ALithiumBatteryChargerboard:

• Fullchargevoltageis4.2V,at1Achargingcurrent,LEDwillchangetobluewhencharged.

• http://www.haoyuelectronics.com/Attachment/TP4056-modules/TP4056.pdf

• Chargestypical3.7VnominalLiPocells,hasvoltageprotection• NotpurchasablebytypicalMSDsources:Amazon,HAOYUelectronics

TPS61072PWMBoostConverter • Inductorrampuptakes~2.3stogettowardsoutputtofinal5Vvalue

fromthevaryingsupplyof4.2Vtominimum~2.8V.• TechnicalSheetishere:

http://www.ti.com/lit/ds/symlink/tps61072.pdf TPS55340FlybackBoostConverter

• Inductorrampuptakesalmost3sbeforetheoutputapproachesthe24Vlevelandsettlesoffnear6ms

• TechnicalSheetishere:http://www.ti.com/general/docs/lit/getliterature.tsp?genericPartNumber=tps55340&fileType=pdf

• 24Vlevelisformeasurementcircuits5VrunstheArduinoandTouchscreenortheLCD.

OtherImportantnotes: • Both24Vlevelandbatteryarecomparedtothe5Vlevel,when

batterylevelislessthan20%or3.125Vthecontrollerwillhaveanalertforlowbatterylevelislow:chargethebattery.

• USBboardischargedviaregularcomputeroroutletwithadapter• Pleasebecarefulwithlivewires.

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• Battery:Ifnecessary,batterymayberemovedandreplaced.Asitislithiumionrechargablethisshouldbeifanemergencyoccurs.Powereverythingoffentirely.Thebatterywillbeinaseparateportionfromthepcb,removetheobjectsarounditandthescrewsorcasing.Inordertoremove,solderingironmustbeusedontheregulationboardcarefullyinordertonotdamagethetester.Eithertheleadsmustbede-solderedcorrectlywithasoldersuckerorresin,andthebatterymovedaway.Theusermaycuttheleadsandreplacethemandthebattery.Eitherthatortherubberoutsidemustbecarefullyremovedandbatterydisconnected.Ifthebatteryisreplaced,theleadsshouldbeconnectedandthebatteryshouldbewrappedasitwasbeforeandsolderedorconnectedbackoncarefully.

3.SwitchingOn

Toswitchtheuniton,simplypressthepowerbutton.Topreservebatterylife,theunitpowersitselfoffafterapproximately30secondsofnonuse.Toshutoffthetesterpressthepowerbuttonfor~3s. Onthetouchscreenthereisanoptiontopressforpoweringoffaswell. Inthesettingselectiononthetouchscreenthereisanoptionforthetimeoutofthethedeviceallowingthe30sautopowerofftobeincreasedordecreasedinincrementsof5s.Afterthetimeoutisadjustedupto1minute,thetimeoutincrementsby15sintervalsupto~5minutes.

4.OperatingModes

TheICtesterhasanumberoftestmodesthatareselectedfromthemainscreen.TheTouchScreenhasasleepmodeitselfwhichdrawslesscurrent.Thetesterwillhaveaperiodafterthetestselectionofexecutingthetests.

5.SelectTest

Ensurethattheoperatingleveronthesocketisintheopen(i.e.up)positionbeforeinsertingtheIC.Closethesocketbyloweringthelever,makingsurethattheICisfirmlyseatedinthesocketandmakinggoodcontact.TheICshouldbeinthebottomoftheZIFsocketasshownhere:

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Selectthechiptobetestedfromthetouchscreen.Onthemainscreenthereare3selections,IC’s,Settings,andpoweroff.

TheIC’sselectionbringstheusertothelistingofIC’savailable.Selectthechiptobetestedfromthetouchscreen.SelectNextifadifferentchipthanwhatisonthecurrentlististobetested.Onceselected,theICspecifictestsrunandanstatusbarshowsthetests’progress.OnceThetestshavebeencompleted,resultsarecompiledandthenwillbedisplayedonthescreen.

Inthesettings,thereisadjustingthetimeoutandloadinganewICtesttobeimplemented.Thetimeoutofthedeviceisinitiallysetat30s.Thismaybeincrementedordecrementedinintervalsof5suptoaminute.Afteraminutetheincrementchangesto15supto~5minutes.

TheHomebuttonreturnstheusertothemainmenu. TheselectionforloadinganewICtest,CanaddICchipsortests.Thisisdescribedindetailin“AddNewTests.”

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6.TestIC ApredeterminedsequenceofsignalsisappliedtotheinputsoftheICasvoltageisappliedtospecificpinsonIC,currentsuppliedismeasuredandvoltageismeasuredonparticularpinsandtheICoutputsaremonitoredforthecorrectlogiclevels.Ifalltheoutputsrespondcorrectly,theresultPASSwillbedisplayedatthetoprightofthedisplay.ThisChipisfunctioningcorrectly. IfacertainoutputisincorrecttheFAILmessagewillappearandwhichtestfailedwiththeerrormessagewillbedisplayedafter. IfashortcircuitbetweenthepowerpinsoftheICisdetected,awarningwillappearonthetoprightofthedisplayand,sincenovalidtestisthenpossible,theresultwillFAIL.

7.TestResults Testresultsasmentionedwillbedisplayedonscreen.ForeachchipthereareErrormessagesforwhichtesthasfailedandtheScreenwilldisplaytheFAILmessage.Screenwilldisplaya~20charactererrormessage.Someexamplesofthesemessagesforeachchipare

• FailedCurrentSensetest:currentdrawtochipistoohigh,likelythechipisburnedoutorshortedsomewhere.

• FailedBiastest:• FailedComparisonmodetest:Opampisnotworking,check

inputcomparisonlevelsandrails.• FailedLogictest:logiclevelsareincorrect,checkconfiguration• FailedOutputVoltagetest:Insufficientoutputorincorrect

output,Chipinternalsmaybedamaged• FailedDiodetest:• FailedInputVoltagetest:Inputvoltageisinsufficientfor

specificdeviceoristoohigh,disconnectandchecktheinputandthevoltagelevelsnecessaryfromthedatasheet.

• FailedEverything:Allthetestsfromthespecificchiparenotasexpected,ifthiscomesupthechipisdefinitelyunusable.

IftheChipfailsoneofthetestsitislikelytofailallofthem,ifitfails~(2-3)+testslikelyinternalcircuitryisdamagedandthechipisunusable.Ifthechipfailedonetestthereislikelyasetupproblem,especiallyiftheerroronishighfor1ofthetests.Theerrormessagewillbesimilarto:“4/5tests

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passed,the5thtestfailedwith65%errormargin.”Ifso,thechipshouldbereconfiguredandtestedagaintoensuretheparticularerror.Iftheerrordisplays“failedeverything”chipiscertainlyunusable.Ifthechippassesthetests,thechipisnottheissue,thestudent/TAshouldchecktheperipheralcircuitryorthelabsetup. Theusermaychangetheerrormessageintheconfigfileifhe/shesodesiresandaddmessageswithnewspecifictests.

8.AddNewTestsNewtestscanbeaddedintheSDcardusingsampleconfigurationfilesanddatasheetsofthenewICs

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9.Specifications

LM741Datasheet: http://www.ti.com/lit/ds/symlink/lm741.pdf 74HC00Datasheet: https://www.fairchildsemi.com/datasheets/MM/MM74HC00.pdf CD4007Datasheet: http://pdf1.alldatasheet.com/datasheet-pdf/view/50835/FAIRCHILD/CD4007.html

Batteries SamsungICR18650-26Hcell.

DCinput 2.8-4.2V,5Vtousb,1Aboardcurrentmax, regulatedviaTP4056.max

Powerconsumption Poweroff max Standby mA Testing ICdependent Testthresholds(internallibrary)

Testthresholds(userlibrary) 0Vto24V settingsbaud,databits,1stopbit,noparity

DimensionsmmXmmXmmapprox. CaseDimensionsmmXmmXmmapprox.

LibraryICs: CD4007,74HC00,LM741

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