Agave11:15 T2000-134-DST

Day 1 Tuesday May 16, 2017 Technical Breakout Sessions

Day 2 Wednesday May 17, 2017 Technical Breakout Sessions

V93000-204-HT OAP-133-DST V93000-111-IT V93000-39-NTS V93000-81-HT V93000-31-HT V93000-36-TM

T2000-202-DST V93000-22-HT OAP-163-DST V93000-114-IT V93000-59-RTTM V93000-67-HT V93000-77-DST V93000-91-TM

T2000-176-HDI V93000-32-HT OAP-196-NTS V93000-158-IT V93000-152-NTS V93000-64-HT V93000-26-RTTM V93000-92-TM

T2000-20-IT V93000-124-HT PI-46-HDI V93000-178-IT V93000-171-NTS V93000-96-HT V93000-38-RTTM V93000-104-TM

T2000-49-IT V93000-25-NTS PI-129-HDI V93000-29-IT V93000-56-NTS V93000-110-HT V93000-47-RTTM V93000-116-TM

T2000-120-IT V93000-98-NTS PI-130-HDI V93000-66-NTS V93000-170-PE V93000-58-RTTM V93000-128-TM

12:00

12:45

2:10

2:55

3:40

4:00

4:45

10:35

11:20

1:35

2:20

3:05

LUNCH & EXPO

12:05 LUNCH & EXPO

BREAK & EXPO

Date Palm Ironwood Joshua Tree Kachina Nopales Ocotillo Pinon

Agave

Tracks

Date Palm Ironwood Joshua Tree Kachina Nopales Ocotillo Pinon

Introduction to SmarTest 8 and Wave Scale

Test Solutions on T2000 IPS for a HSIF with LVDS Transmitter-Receiver in an Automotive Product

CloudTesting Service Adoption in Qualcomm

V93000: Improved Throughput Through DCSIGNALs

A New BBIQ Calibration Solution for Both V93000 MBAV8 4S4M Card and 8M Card

V93000 Spike Checking with Higher Efficiency and Better Coverage

DigRF LTE-A Transceiver Test Program Migration From SmarTest 7 Port Scale RF to SmarTest 8 Wave Scale RF

Auto-Correlation Function: An Alternative to Test PRBSn Transmitter Device

Mixed-Signal Testing with Wave Scale MX

ADC and DAC Testing with GPWGD for STMicroelectronics’ MCD Microcontroller Devices

Solutions for IoT (Internet of Things) Modules by EVA 100

High Parallelism Probe Card on V93000 Direct Dock System to Increase Testing Throughput on Automotive

A New Approach for aGeneric Test Method Libraryto Increase Efficiency byKeeping Maximum Flexibility

V93000 Interface Tool for Fast and Easy Pattern Bring-Up and Design Validation

Extending the TMU to Solve Linearity Measurement Challenges on a Precision PWM

Powerful Customized Characterization Tool for Device Release

Parallel RX and Duplex Testing for Improving Test Coverage and Test Time

Use of Two Low-Cost Hardware Concepts to Speed Up the Test Development Cycle on T2000 IPS

The HA1000: A New Instrument to Meet New Needs of the Industry

Inertial Sensor Test on V93000

SerDes Technology and Test Solution

IoT and the V93000: Superior Cost of Test Through Advanced System Architecture and Test Methodology

Introduction of a Web-Based Test Plan and Test Program Generation Tool

New Test Approach for Traditional Output DC TM for Test Time Reduction

Case Study of an 8-Site LTE-A RF Transceiver Conversion from SmarTest 7 Port Scale RF to SmarTest 8 Wave Scale RF

Using Edge Shift to Measure Pin-to-Pin Performance in a Multi-Site Environment

A Unique Way to Evaluate a Complete Signal Path for 20+ Gbps Loopback Test in High-Volume Production

Test Cost Reduction: How Low Can We Go?

Quick Identification and Prevention of Harmful States in Test Program

Using AVI64’s New Features to Meet the Test Challenges of Automotive Devices

Automatic V93000 Pattern Set-Up Solutions for Sensor ASIC Device Test

Timing-Saving Technique with Loop Structure Replacing Shmoo Test

Instant Power Changes to Dramatically Reduce Test Time with Wave Scale RF

Successful Concurrent Test Solution by T2000 IPS

Enlightened Power Integrity for Loadboards and Probe Cards

Power Supply Alarm Root Cause Isolation

How to Make Use of AVI64 with High Efficiency in Power and Analog Testing

Testing Automotive Airbag System Devices on the V93000

A Novel Automatic Test Program Generation System Based on Standardized Device Test Plan

Current Profiling Solution Using UHC4 High-Speed Sampler with SmartRDI

Learnings and Highlights in SmarTest 8 for a Leading Edge Application Processor

Test Condition Run-Time Optimizer for Test Time Reduction

80+ GHz Low-Loss Transmission from Tester to DUT

V93000-34-ITPattern Conversion: Standardizing the Process and Reducing STIL Conversion Times

V93000 32 Gbps High-Speed Extension Solution to Test High-End GPU

PE Tools New API for Generic Pattern Generation with Protocol Support and Lab/Bench Compatibility

Capacitance Measurements with V93000: From Parallel Sensor Production to Loadboard Verify

T2000-40-NTS V93000-204-HT PI-19-PE V93000-35-IT V93000-186-NTS V93000-28-PE V93000-79-RTTM V93000-137-TMIntroduction to SmarTest 8 and Wave Scale

ST MDG MCD Current Sensor Trimming and Characterization Using T2000 PMU32 VI

Git: Distributed Revision Control System

ProgCheck: An Error Catching, Pre-Program Loading and Path Validation Tool

Understanding PMUX and AVI64 Best Practices

GPIB Analyzer An Auto Spike/Wave Checker Tool on V93000

Test Method Self-Adapted Execution for Device Characterization and Automatic Control

T2000-54-NTS V93000-183-NTS PTC-199-HDI V93000-131-NTS V93000-63-PE V93000-85-RTTM V93000-148-TMInstrument Synchronization in SmarTest 8: RF to MX to DC to Digital

The Challenges of Testing IoT Modules on T2000 AiR

Handling Solution for Stack Memory: M6245 with Active Thermal Control and Visual Alignment

V93000-84-ITBest Throughput Practices for Active Run-Time Pattern Modification on V93000

Universal Device Interface (UDI) RF Test Solution: 60 GHz Over the Air

Automatic Calibration File Selector

Smart Control of a High Quantity of Loadboard Switches (Utility and PMUX)

A Novel UDI Implementation of Jitter Separation and Eye Test with Coherent Sampling

T2000-203-NTS V93000-166-RTTM V93000-105-HDI V93000-108-IT V93000-143-NTS V93000-65-PE V93000-102-RTTM V93000-160-TMSwift Development and Rapid Deployment of IP Libraries with SmarTest 8

Generic Approach for DUT Protocol Management in OTPL for T2000 IPS

Test Temperature Control System on Pin Scale 1600 Implemented by the Automotive Area

“Immediate Upload” Further Improving Digital Capture Test Throughput

A Programming Framework of Multi-Lane SerDes Device Test Solution Based on D2S Protocol Aware

Switch Test Condition for Custom Part Number and Process by Recipe File

Speeding Up Pattern Validation Process and Accelerating Time to Market

Test Solution of SerDes SSC

V93000-86-DST V93000-193-RTTM V93000-27-DST V93000-181-NTS V93000-144-NTS V93000-155-PE V93000-125-RTTM V93000-179-TMFlexible Parametric Shmoo Capability on SmarTest 8 for Mixed-Signal/RF Device Characterizations

Introduce Fast Eye Mask Detection to Reduce the Test Time of High-Speed Transmitter Characterization

A Calibration Procedure for the UDI 77-GHz Stimulus

Demodulation Tests in SmarTest 7 and SmarTest 8 (LTE, 802.11AX and More)

High-Speed SerDes At-Speed Testing Application

A Test Program Integrity Assurance for Outsourcing

An Interactive Tool to Generate a Program for TP360 Apps from a Test Flow

High-Speed ATPG Testing Using Statistical Multi-Shmoo Analysis

V93000-157-DST

PE ProductEngineering

Device SpecificTestingDST Reducing

Time-to-MarketRTTM TestMethodologiesTMHardware Design

and IntegrationHDI ImprovingThroughputITHot TopicsHT

V93000-60-TM V93000-161-HDI V93000-188-NTS V93000-187-NTS V93000-159-PE V93000-142-RTTM V93000-195-TMFrequency Division Measurement Enables Parallelism for RF Testing Devices with Wave Scale RF

OOB Test Solution in HSIO V93000 Loadboard Checker Library

802.11ax: Next-Generation WiFi Communications

PSI5 and DSI3 Testing Strategy Using the AVI64

V93000 Pattern Generator for SmartRDI

A New Script Language for Test Program Auto-Generation Tool Rapid Development

Contact Resistance Importance and Measurement Techniques

New HW/SWTest SolutionsNTS