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SJTU Zhou Lingling 1 Chapter Chapter 1 1 Diodes Diodes

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Page 1: Chapter1 Diodes

SJTU Zhou Lingling 1

ChapterChapter 11

DiodesDiodes

Page 2: Chapter1 Diodes

SJTU Zhou Lingling 2

Outline of Chapter 1

1.1 Introduction1.2 Basic Semiconductor Concepts1.3 The pn Junction1.4 Analysis of diode circuits1.5 Applications of diode circuits

Page 3: Chapter1 Diodes

SJTU Zhou Lingling 3

1.1 Introduction

• The diode is the simplest and most fundamental nonlinear circuit element.

• Just like resistor, it has two terminals.• Unlike resistor, it has a nonlinear current-

voltage characteristics.• Its use in rectifiers is the most common

application.

Page 4: Chapter1 Diodes

SJTU Zhou Lingling 4

Physical Structure

The most important region, which is called pn junction, is the boundary between n-type and p-type semiconductor.

Page 5: Chapter1 Diodes

SJTU Zhou Lingling 5

Symbol and Characteristic for the Ideal Diode

(a) diode circuit symbol; (b) i–v characteristic; (c) equivalent circuit in the reverse direction; (d) equivalent circuit in the forward direction.

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SJTU Zhou Lingling 6

Characteristics

• Conducting in one direction and not in the other is the I-V characteristic of the diode.

• The arrowlike circuit symbol shows the direction of conducting current.

• Forward biasing voltage makes it turn on.

• Reverse biasing voltage makes it turn off.

Page 7: Chapter1 Diodes

SJTU Zhou Lingling 7

1.2 Basic Semiconductor Concepts

• Intrinsic Semiconductor• Doped Semiconductor• Carriers movement

Page 8: Chapter1 Diodes

SJTU Zhou Lingling 8

Intrinsic Semiconductor

• DefinitionA crystal of pure and regular lattice structure is called intrinsic semiconductor.

• MaterialsSilicon---today’s IC technology is based

entirely on siliconGermanium---early used Gallium arsenide---used for microwave circuits

Page 9: Chapter1 Diodes

SJTU Zhou Lingling 9

Intrinsic Semiconductor(cont’d)

Two-dimensional representation of the silicon crystal. The circles represent the inner core of silicon atoms, with +4 indicating its positive charge of +4q, which is neutralized by the charge of the four valence electrons. Observe how the covalent bonds are formed by sharing of the valence electrons. At 0 K, all bonds are intact and no free electrons are available for current conduction.

Page 10: Chapter1 Diodes

SJTU Zhou Lingling 10

Intrinsic Semiconductor(cont’d)

At room temperature, some of the covalent bonds are broken by thermal ionization. Each broken bond gives rise to a free electron and a hole, both of which become available for current conduction.

Page 11: Chapter1 Diodes

SJTU Zhou Lingling 11

Intrinsic Semiconductor(cont’d)

• Thermal ionizationValence electron---each silicon atom has four

valence electronsCovalent bond---two valence electrons from

different two silicon atoms form the covalent bond Be intact at sufficiently low temperature Be broken at room temperature

Free electron---produced by thermal ionization, move freely in the lattice structure.

Hole---empty position in broken covalent bond,can be filled by free electron, positive charge

Page 12: Chapter1 Diodes

SJTU Zhou Lingling 12

Intrinsic Semiconductor(cont’d)

• CarriersA free electron is negative charge and a hole is positive charge. Both of them can move in the crystal structure. They can conduct electric circuit.

Page 13: Chapter1 Diodes

SJTU Zhou Lingling 13

Intrinsic Semiconductor(cont’d)

• RecombinationSome free electrons filling the holes results in the disappearance of free electrons and holes.

• Thermal equilibriumAt a certain temperature, the recombination rate is equal to the ionization rate. So the concentration of the carriers is able to be calculated.

Page 14: Chapter1 Diodes

SJTU Zhou Lingling 14

Intrinsic Semiconductor(cont’d)

• Carrier concentration in thermal equilibrium

• At room temperature(T=300K)

carriers/cm3

inpn kTE

iGeBTn 32

10105.1 in

Page 15: Chapter1 Diodes

SJTU Zhou Lingling 15

Intrinsic Semiconductor(cont’d)

Important notes:• has a strong function of temperature.

The high the temperature is, the dramatically great the carrier concentration is.

• At room temperature only one of every billion atoms is ionized.

• Silicon’s conductivity is between that of conductors and insulators. Actually the characteristic of intrinsic silicon approaches to insulators.

in

Page 16: Chapter1 Diodes

SJTU Zhou Lingling 16

Doped Semiconductor

• Doped semiconductors are materials in which carriers of one kind predominate.

• Only two types of doped semiconductors are available.

• Conductivity of doped semiconductor is much greater than the one of intrinsic semiconductor.

• The pn junction is formed by doped semiconductor.

Page 17: Chapter1 Diodes

SJTU Zhou Lingling 17

Doped Semiconductor(cont’d)

n type semiconductor• Concept

Doped silicon in which the majority of charge carriers are the negatively charged electrons is called n type semiconductor.

• Terminology Donor---impurity provides free electrons, usually entirely ionized. Positive bound charge---impurity atom donating electron gives rise

to positive bound charge carriers

• Free electron---majority, generated mostly by ionized and slightly by thermal ionization.

• Hole---minority, only generated by thermal ionization.

Page 18: Chapter1 Diodes

SJTU Zhou Lingling 18

Doped Semiconductor(cont’d)

A silicon crystal doped by a pentavalent element. Each dopant atom donates a free electron and is thus called a donor. The doped semiconductor becomes n type.

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SJTU Zhou Lingling 19

Doped Semiconductor(cont’d)

p type semiconductor• Concept

Doped silicon in which the majority of charge carriers are the positively charged holes is called p type semiconductor.

• Terminology acceptor---impurity provides holes, usually entirely ionized. negatively bound charge---impurity atom accepting hole give rise

to negative bound charge carriers

• Hole---majority, generated generated mostly by ionized and slightly by thermal ionization.

• Free electron---minority, only generated by thermal ionization.

Page 20: Chapter1 Diodes

SJTU Zhou Lingling 20

Doped Semiconductor(cont’d)

A silicon crystal doped with a trivalent impurity. Each dopant atom gives rise to a hole, and the semiconductor becomes p type.

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SJTU Zhou Lingling 21

Doped Semiconductor(cont’d)

Carrier concentration for n typea) Thermal equilibrium equation

b) Electric neutral equation

200 inn npn

Dnn Npn 00

Page 22: Chapter1 Diodes

SJTU Zhou Lingling 22

Doped Semiconductor(cont’d)

Carrier concentration for p typea) Thermal equilibrium equation

b) Electric neutral equation

200 ipp nnp

App Nnp 00

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SJTU Zhou Lingling 23

Doped Semiconductor(cont’d)

Because the majority is much great than the minority, we can get the approximate equations shown below:

for n type for p type

D

in

Dno

Nnp

Nn2

0

A

ip

Ap

Nnn

Np2

0

0

Page 24: Chapter1 Diodes

SJTU Zhou Lingling 24

Doped Semiconductor(cont’d)

• ConclusionMajority carrier is only determined by the

impurity, but independent of temperature.Minority carrier is strongly affected by

temperature.If the temperature is high enough,

characteristics of doped semiconductor will decline to the one of intrinsic semiconductor.

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SJTU Zhou Lingling 25

Doped Semiconductor(cont’d)

• Doping compensation n type semiconductor is generated by

donor diffusion, then injecting acceptor into the specific area(assuming ) forms p type semiconductor. The boundary between n and p type semiconductor is the pn junction. This is the basic step for VLSI fabrication technology.

ND

NA

DA NN

Page 26: Chapter1 Diodes

SJTU Zhou Lingling 26

Carriers Movement

There are two mechanisms by which holes and free electrons move through a silicon crystal.

• Drift--- The carrier motion is generated by the electrical field across a piece of silicon. This motion will produce drift current.

• Diffusion--- The carrier motion is generated by the different concentration of carrier in a piece of silicon. The diffused motion, usually carriers diffuse from high concentration to low concentration, will give rise to diffusion current.

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SJTU Zhou Lingling 27

Drift and Drift Current

• DriftDrift velocities

Drift current densities

Ev

Ev

ndrift

pdrift

np ,

EqpJ

EqnEqnJ

pdriftp

nndriftn

)()(

Where are the constants called mobility of holes and electrons respectively.

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SJTU Zhou Lingling 28

Drift and Drift Current

• Total drift current density

• Resistivity

EpnqJ pndrift ) +(

)(1

pn pnq +

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SJTU Zhou Lingling 29

Drift and Drift Current

• Resistivities for doped semiconductor

* Resistivities are inversely proportional to the concentration of doped impurities.

• Temperature coefficient(TC)TC for resistivity of doped semiconductor is positive due to negative TC of mobility

pA

nD

pnqN

qNpnq

1

1

)(1 For n type

For p type

Page 30: Chapter1 Diodes

SJTU Zhou Lingling 30

Drift and Drift Current

• Resistivity for intrinsic semiconductor

* Resistivity is inversely proportional to the carrier concentration of intrinsic semiconductor.

• Temperature coefficient(TC)TC for resistivity of intrinsic semiconductor is negative due to positive TC of .

)(1

)(1

pnipn qnpnq

in

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SJTU Zhou Lingling 31

Diffusion and Diffusion Current

• diffusion

A bar of intrinsic silicon (a) in which the hole concentration profile shown in (b) has been created along the x-axis by some unspecified mechanism.

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SJTU Zhou Lingling 32

Diffusion and Diffusion Current

where are the diffusion constants or diffusivities for hole and electron respectively.

* The diffusion current density is proportional to the slope of the the concentration curve, or the concentration gradient.

dxxdnqDJ

dxxdpqDJ

nn

pp

)(

)(

np DD ,

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SJTU Zhou Lingling 33

Einstein Relationship

Einstein relationship exists between the carrier diffusivity and mobility:

Where VT is Thermal voltage.

At room temperature ,

qkTV

DDT

p

p

n

n

mvVT 25

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SJTU Zhou Lingling 34

1.3 pn Junction

• The pn junction under open-circuit condition

• I-V characteristic of pn junctionTerminal characteristic of junction diode.Physical operation of diode.

• Junction capacitance

Page 35: Chapter1 Diodes

SJTU Zhou Lingling 35

pn Junction Under Open-Circuit Condition

• Usually the pn junction is asymmetric, there are p+n and pn+.

• The superscript “+” denotes the region is more heavily doped than the other region.

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SJTU Zhou Lingling 36

pn Junction Under Open-Circuit Condition

Fig (a) shows the pn junction with no applied voltage (open-circuited terminals).

Fig.(b) shows the potential distribution along an axis perpendicular to the junction.

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SJTU Zhou Lingling 37

Procedure of Forming pn Junction

The procedure of forming pn the dynamic equilibrium of drift and diffusion movements for carriers in the silicon. In detail, there are 4 steps:

a) Diffusion

b) Space charge region

c) Drift

d) Equilibrium

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SJTU Zhou Lingling 38

Procedure of Forming pn Junction

• diffusionBoth the majority carriers diffuse across the

boundary between p-type and n-type semiconductor.

The direction of diffusion current is from p side to n side.

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SJTU Zhou Lingling 39

Procedure of Forming pn Junction

• Space charge regionMajority carriers recombining with minority carriers

results in the disappearance of majority carriers.Bound charges, which will no longer be neutralized by

majority carriers are uncovered.There is a region close to the junction that is depleted of

majority carriers and contains uncovered bound charges.This region is called carrier-depletion region or space

charge region.

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SJTU Zhou Lingling 40

Procedure of Forming pn Junction

• DriftElectric field is established across the space charge

region.Direction of electronic field is from n side to p side. It helps minority carriers drift through the junction. The

direction of drift current is from n side to p side. It acts as a barrier for majority carriers to diffusion.

Page 41: Chapter1 Diodes

SJTU Zhou Lingling 41

Procedure of Forming pn Junction

• EquilibriumTwo opposite currents across the junction is

equal in magnitude.No net current flows across the pn junction.Equilibrium conduction is maintained by the

barrier voltage.

Page 42: Chapter1 Diodes

SJTU Zhou Lingling 42

Junction Built-In Voltage

The Junction Built-In Voltage

It depends on doping concentration and temperature

Its TC is negative.

2lni

DATo n

NNVV

Page 43: Chapter1 Diodes

SJTU Zhou Lingling 43

Width of the Depletion Region

Width of the Depletion Region:

Depletion region exists almost entirely on the slightly doped side.

Width depends on the voltage across the junction.

oDA

depo VNNq

W )11(2

))11(2 VVNNq

W oDA

dep -(

Page 44: Chapter1 Diodes

SJTU Zhou Lingling 44

I-V Characteristics

The diode i–v relationship with some scales expanded and others compressed in order to reveal details

Page 45: Chapter1 Diodes

SJTU Zhou Lingling 45

I-V Characteristic Curve

Terminal Characteristic of Junction Diodes• The Forward-Bias Region, determined by

• The Reverse-Bias Region, determined by

• The Breakdown Region, determined by

ov

0 vVZK

ZKVv

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SJTU Zhou Lingling 46

The pn Junction Under Forward-Bias Conditions

The pn junction excited by a constant-current source supplying a current I in the forward direction.

The depletion layer narrows and the barrier voltage decreases by V volts, which appears as an external voltage in the forward direction.

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SJTU Zhou Lingling 47

The pn Junction Under Forward-Bias Conditions

Minority-carrier distribution in a forward-biased pn junction. It is assumed that the p region is more heavily doped than the n region; NA >>ND.

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SJTU Zhou Lingling 48

The pn Junction Under Forward-Bias Conditions

Excess minority carrier concentration:

Exponential relationshipSmall voltage incremental give rise to great incremental

of excess minority carrier concentration.

T

T

Vv

ppp

Vv

nnn

enxn

epxp

0

0

)(

)(

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SJTU Zhou Lingling 49

The pn Junction Under Forward-Bias Conditions

Distribution of excess minority concentration:

Where

are called excess-minority-carrier lifetime.

n

p

pn

Lxx

ppppp

Lxx

nnnnon

enxnnxn

epxppxp)(

00

)(

0

])([)(

])([)(+

nnn

ppp

DL

DL

pn ,

Page 50: Chapter1 Diodes

SJTU Zhou Lingling 50

The pn Junction Under Forward-Bias Conditions

The total current can be obtained by the diffusion current of majority carriers.

)1)((

)()((

)(

00

T

pn

VV

n

pn

p

np

xxxx

nDpD

nDpD

eLnD

LpD

Aq

dxxdnq

dxxdpqA

JJA

III

Page 51: Chapter1 Diodes

SJTU Zhou Lingling 51

The pn Junction Under Forward-Bias Conditions

The saturation current is given by :

)(

)(

2

00

An

n

Dp

pi

n

pn

p

nps

nLD

nLD

qAn

LnD

LpD

qAI

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SJTU Zhou Lingling 52

The pn Junction Under Forward-Bias Conditions

I-V characteristic equation:

• Exponential relationship, nonlinear.• Is is called saturation current, strongly

depends on temperature.• or 2 , in general • VT is thermal voltage.

)1 TnVv

s eIi (

1n 1n

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SJTU Zhou Lingling 53

The pn Junction Under Forward-Bias Conditions

assuming V1 at I1 and V2 at I2

then:

* For a decade changes in current, the diode voltage drop changes by 60mv (for n=1) or 120mv (for n=2).

1

2

1

212 lg3.2ln I

InVIInVVV TT

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SJTU Zhou Lingling 54

The pn Junction Under Forward-Bias Conditions

• Turn-on voltage

A conduction diode has approximately a constant voltage drop across it. It’s called turn-on voltage.

• Diodes with different current rating will exhibit the turn-on voltage at different currents.

• Negative TC,

VV

VV

onD

onD

25.0

7.0

)(

)(

For silicon

For germanium

CmvTC /2

Page 55: Chapter1 Diodes

SJTU Zhou Lingling 55

The pn Junction Under Reverse-Bias Conditions

The pn junction excited by a constant-current source I in the reverse direction.

To avoid breakdown, I is kept smaller than IS.

Note that the depletion layer widens and the barrier voltage increases by VR volts, which appears between the terminals as a reverse voltage.

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SJTU Zhou Lingling 56

The pn Junction Under Reverse-Bias Conditions

I-V characteristic equation:

Where Is is the saturation current, it is proportional to ni2

which is a strong function of temperature.

sIi

)(

)(

2

00

An

n

Dp

pi

n

pn

p

nps

nLD

nLD

qAn

LnD

LpD

qAI

Independent of voltage 。

Page 57: Chapter1 Diodes

SJTU Zhou Lingling 57

The pn Junction In the Breakdown Region

The pn junction excited by a reverse-current source I, where I > IS. The junction breaks down, and a voltage VZ , with the polarity indicated, develops across the junction.

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SJTU Zhou Lingling 58

The pn Junction In the Breakdown Region

• Supposing , the current source will move holes from p to n through the external circuit.

• The free electrons move through opposite direction.

• This result in the increase of barrier voltage and decrease almost zero of diffusion current.

• To achieved the equilibrium, a new mechanism sets in to supply the charge carriers needed to support the current I.

sII

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SJTU Zhou Lingling 59

Breakdown Mechanisms

• Zener effect Occurs in heavily doping semiconductor Breakdown voltage is less than 5v. Carriers generated by electric field---field ionization. TC is negative.

• Avalanche effect. Occurs in slightly doping semiconductor Breakdown voltage is more than 7v. Carriers generated by collision. TC is positive.

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SJTU Zhou Lingling 60

Breakdown Mechanisms

Remember:

pn junction breakdown is not a destructive process, provided that the maximum specified power dissipation is not exceeded.

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SJTU Zhou Lingling 61

Zener Diode

Circuit symbol

The diode i–v characteristic with the breakdown region shown in some detail.

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SJTU Zhou Lingling 62

Junction Capacitance

• Diffusion Capacitance Charge stored in bulk region changes with the change of voltage

across pn junction gives rise to capacitive effect.

Small-signal diffusion capacitance

• Depletion capacitance Charge stored in depletion layer changes with the change of

voltage across pn junction gives rise to capacitive effect.

Small-signal depletion capacitance

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SJTU Zhou Lingling 63

Diffusion Capacitance

According to the definition:

The charge stored in bulk region is obtained from below equations:

Qd dV

dQC

pp

pnonn

x nonp

I

LpxpAq

dxpxpAqQn

])([

])([

n n nI Q

Page 64: Chapter1 Diodes

SJTU Zhou Lingling 64

Diffusion Capacitance

The expression for diffusion capacitance:

Forward-bias, linear relationship

Reverse-bias, almost inexistence

0

)(

)(

][

QT

T

QT

T

VV

sTd

IV

IV

eIdVdC T

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SJTU Zhou Lingling 65

Depletion Capacitance

According to the definition:

Actually this capacitance is similar to parallel plate capacitance.

QR VVRj dV

dQC

)1(

))(11(2[

0

0

o

R

j

RBA

depj

VV

C

vVNNq

AW

AC

Page 66: Chapter1 Diodes

SJTU Zhou Lingling 66

Depletion Capacitance

• A more general formula for depletion capacitance is :

• Where m is called grading coefficient.

• If the concentration changes sharply, • Forward-bias condition,• Reverse-bias condition,

mR

jj V

CC

)V1(0

0

21~

31

m

21

m

02 jj CC dj CC

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SJTU Zhou Lingling 67

Junction Capacitance

Remember:

a) Diffusion and depletion capacitances are incremental capacitances, only are applied under the small-signal circuit condition.

b) They are not constants, they have relationship with the voltage across the pn junction.

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1.4 Analysis of Diode Circuit

• ModelsMathematic modelCircuit model

• Methods of analysisGraphical analysisIterative analysisModeling analysis

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SJTU Zhou Lingling 69

The Diode Models

Mathematic Model :

The circuit models are derived from approximating the curve into piecewise-line.

s

nVv

s

nVv

s

IeI

eIi

T

T )1(

Forward biased

Reverse biased

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SJTU Zhou Lingling 70

The Diode Models

Circuit Modela) Simplified diode model

b) The constant-voltage-drop model

c) Small-signal model

d) High-frequency model

e) Zener Diode Model

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SJTU Zhou Lingling 71

Simplified Diode Model

Piecewise-linear model of the diode forward characteristic and its equivalent circuit representation.

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The Constant-Voltage-Drop Model

The constant-voltage-drop model of the diode forward characteristics and its equivalent-circuit representation.

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SJTU Zhou Lingling 73

Small-Signal Model

Symbol convention: Lowercase symbol, uppercase subscript stands

for total instantaneous qualities. Uppercase symbol, uppercase subscript stands

for dc component. Lowercase symbol, lowercase subscript stands

for ac component or incremental signal qualities. Uppercase symbol, lowercase subscript stands

for the rms(root-mean-square) of ac.)(tId

)(tid

DI

)(tiD

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SJTU Zhou Lingling 74

Small-Signal Model

Development of the diode small-signal model. Note that the numerical values shown are for a diode with n = 2.

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SJTU Zhou Lingling 75

Small-Signal Model(cont’d)

Incremental resistance:

*The signal amplitude sufficiently small such that the excursion at Q along the i-v curve is limited to a short, almost linear segment.

DQ

Td I

Vr

Page 76: Chapter1 Diodes

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High-Frequency Model

High frequency model

rd

rs

cj

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SJTU Zhou Lingling 77

Zener Diode Model

ZZZZ rIVV 0

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Method of Analysis

Load line

Diode characteristic

Q is the intersect point

Visualization

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Method of Analysis

• Iterative analysisRefer to example 3.4

• Model AnalysisRefer to example 3.6 and 3.7

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1.5 The Application of Diode Circuits

• Rectifier circuitsHalf-wave rectifierFull-wave rectifier

• Transformer with a center-tapped secondary winding• Bridge rectifier

The peak rectifier• Voltage regulator• Limiter

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SJTU Zhou Lingling 81

Half-Wave Rectifier

(a) Half-wave rectifier.

(b) Equivalent circuit of the half-wave rectifier with the diode replaced with its battery-plus-resistance model.

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Half-Wave Rectifier

(c) Transfer characteristic of the rectifier circuit.

(d) Input and output waveforms, assuming that RrD

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Full-Wave Rectifier

(a) circuit(b) transfer characteristic assuming a constant-voltage-drop model for

the diodes

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Full-Wave Rectifier

(c) input and output waveforms.

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The Bridge Rectifier

(a) circuit

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The Bridge Rectifier

(b) input and output waveforms

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Peak Rectifier

Voltage and current waveforms in the peak rectifier circuit with .

The diode is assumed ideal.

TCR

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Voltage Regulator

We define:

s

oV

VtionLineregula

L

oI

VtionLoadregula

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Limiter

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SJTU Zhou Lingling 90

Limiter

Applying a sine wave to a limiter can result in clipping off its two peaks.

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Soft Limiting