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1 Chairs Report The IEC TC93 Meetings were held September 6-7, in Seoul, South Korea. The Standards Board Meetings were held September 8-10 also in Seoul, South Korea. --The Standards Board Meetings adjourned ~ 6 hours ago--

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Chairs Report. The IEC TC93 Meetings were held September 6-7, in Seoul, South Korea. The Standards Board Meetings were held September 8-10 also in Seoul, South Korea. --The Standards Board Meetings adjourned ~ 6 hours ago--. 1. Introduction. SCC20 is a: Individual based - PowerPoint PPT Presentation

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Page 1: Chairs Report

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Chairs Report

The IEC TC93 Meetings were held September 6-7, in Seoul, South Korea.

The Standards Board Meetings were held September 8-10 also in Seoul, South Korea.

--The Standards Board Meetings adjourned ~ 6 hours ago--

Page 2: Chairs Report

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Introduction

• SCC20 is a:• Individual based

• meaning members vote as individuals and not for a corporation/entity.

• IEEE Type 2 Standards Coordinating Committee (SCC)• meaning we develop standards.

• Sponsors:– IEEE Societies

• Computer• Instrumentation and Measurement• Aerospace and Electronic Systems

– Additional Liaisons with• US DoD• UK MoD• National Defense Industry Association (NDIA)

Page 3: Chairs Report

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Introduction

• The orderly transaction of business of SCC20, which acts as sponsor for individual standards projects take precedence in the following order:

• New York State Not-for-Profit Law• IEEE Certificate of Incorporation• IEEE Constitution• IEEE Bylaws (includes IEEE Standards Association Bylaws)• IEEE Policy & Procedures Manual• IEEE Board of Directors Resolutions• IEEE Standards Association Operations Manual• IEEE-SA Board of Governors Resolutions• IEEE-SA Standards Board Bylaws• IEEE-SA Standards Board Operations Manual• SCC20 Operating Procedures – June 2011

• SCC20 Subcommittee Operating Procedures – July/August 2011• Robert's Rules of Order Newly Revised (RONR)

Page 4: Chairs Report

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SCC20 Operating Procedures• IEEE Standards Association (IEEE-SA) Sponsor Operating

Procedures IEEE Standards Coordinating Committee 20.• Version 16, Compliant with the June 2009 IEEE-SA SCC Type 2

Operating Procedures Template.

• Access only via the IEEE-SA website, copies shall not be posted on SCC20 related web pages.

• No Term Limits for SCC20 Chair, Vice Chair, Secretary• Each must now be IEEE-SA member

• No Requirements Documents• Vice Chair is Responsible for ADMIN• “Saved”

• SCC20 Subcommittees, SCC20 Steering, SCC20 ADMIN, SCC20 Elections, SCC20 Liaison Voting Rights, SCC20 Blue Sheets, Subcommittee Co-Chairs

• “Gone”• Secretaries Notebook

Page 5: Chairs Report

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SCC20 Operating Procedures• “New”

• Quorum for a working group meeting is of the Working Group full membership (members whom have met membership criteria).

• SCC20 Subcommittees oversee their working groups, and report to Steering.

• Subcommittee Co-Chairs name the Working Group Chair.• Working groups under a subcommittee operate under that

subcommittee's P&P.• Working group must reach consensus of the WG full membership before

going to sponsor ballot.

• I am in the process of creating a “SCC20 Operations Clarification” Document.

• A Subcommittee/Working Group P&P was to be submitted to AudCom by Mid-August (2 months after approval of the SCC20 Operating Procedures).

• Extension was granted.

• I have generated updated Subcommittee P&Ps for each Standards Developing Subcommittee.

Page 6: Chairs Report

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Introduction

• SCC20 is presently developing and/or maintaining a total of 27 IEEE Standards *

• 17 are Full-Use Standards.• 3 are Trial-Use Standards.• 5 are Users Guides.• 2 are Recommended Practices.

Document: Published In Work – New

In Work - Revision

New PARs

Reaffirming

Standards 16 4 7

Users Guides 3 2 1 1

Rec. Practices 2

Totals 19 8 8 1

* We had 8 in 2003 and 22 in 2010

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Chair: Mike Seavey (Northrop Grumman)

Vice Chair: Chris Gorringe (CASSIDIAN Test Engineering Services UK)Secretary: Dave Droste (DRS-TEM)

LiaisonsJohn Sheppard (CS), Joe Stanco (I&M), Joe Stanco (AES),Bill Ross (DoD), Malcolm Brown (MoD), Les Orlidge (NDIA)

Administrative (ADMIN)SCC20 Vice-Chair

Chris Gorringe

Hardware Interfaces (HI)Co-Chair: Mike Stora (SysIntech)

Co-Chair: Dave Droste (DRS-TEM)Secretary: Tony Geneva (DoD)

Diagnostic and Maintenance Control (DMC)Co-Chair: Tim Wilmering (Boeing)

Co-Chair: John Sheppard (Montana State University)Secretary: John Sheppard (Montana State University)

Test and ATS Description (TAD)Co-Chair: Ashley Hulme (CASSIDIAN Test Engineering

Services UK)Co-Chair: Ion Neag (Pioneering Decisive Solutions)

Secretary:

Test Information Integration (TII)Co-Chair: Teresa Lopes (Teradyne)

Co-Chair: Chris Gorringe (CASSIDIAN Test Engineering Services UK)

Secretary:

IEEE-1505Receiver Fixture Interface (RFI)

IEEE-P1505.1Common Test Interface Pin Map

IEEE-1232AI-ESTATE

IEEE-1641STD

IEEE-716C/ATLAS

IEEE-771Guide to the use of ATLAS

IEEE-1641.1Guide to the use of STD

IEEE-1671.1Test Description

IEEE-1671.2Instrument Description

IEEE-1671ATML Overview and Architecture

IEEE-1671.3UUT Description

IEEE-1671.4Test Configuration

IEEE-1671.5Test Adapter

IEEE-1671.6Test Station

SCC-20 Organization - 2011IEEE Staff Liaison

Kathryn Bennett

IEEE-1636SIMICA

IEEE-1636.1Test Results and Session Information

IEEE-P1636.2MAI

IEEE-1445DTIF

IEEE-1546DTIF Guide

IEEE-P1505.1.1Common Test Interface XML Instance

IEEE-P1636.99SIMICA Common

IEEE-P1232.3AI-ESTATE Users Guide

As of September 10, 2011

IEEE-P1505.3Test Interface and Pin Configuration

for Portable/Bench Top Test

IEEE-P1671.0Guide for the Use of ATML

IEEE-P1871.1Recommended Practice: IEEE 1671.2

Instrument Description Templates

IEEE-P1871.2Recommended Practice: IEEE 1671

Intrinsic Signal Path Information

In IEEE Ballot Process

Published Trial-Use Standard

Published Standard

Project in Work: Not Previously Published

Shadow indicates there is a PAR for the development of

or revision to

Legend:

IEEE-SA Standards Board

IEEE-P693Standard for Modular Interconnect Packaging for Scalable Systems

Page 8: Chairs Report

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SCC20 2010 Roster(as of April 25, 2011)

• Of the 109 in 2011• 60 are Members

• 49 are Interested Parties

• Of the 93 in 2010• 69 are Members

• 24 are Interested Parties• US = 76, UK = 6, Germany = 4, France = 2• Spain, Sweden, India, China, and Australia = 1 ea.

• US = 90, UK = 10, Germany = 4, France = 2• Spain, Canada, Japan = 1 ea.

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The IEEE and SCC20

Sponsors:Aerospace Electronic Systems Society

Computer SocietyInstrumentation and Measurement Society

Sponsors:Aerospace Electronic Systems Society

Computer SocietyInstrumentation and Measurement Society

1964 through 1972ARINC

ATLAS Language

Mid-1970'sIEEE SCC20

“The ATLAS Committee”

Mid-2000'sIEEE SCC20

“Test and Diagnosis for Electronic Systems”

1884American Institute of Electrical

Engineers (AIEE)

1963AIEE and IRE Merge

1973IEEE Standards Board Established

1998IEEE Standards Association

(IEEE-SA)

There are 9 SCC’s, 38 Societies,

~1,000 active standards; ~400 standards in development

~7,000 individual and ~200 corporate members

1912The Institute of Radio Engineers (IRE) Forms its First Standards

Committee

1972 through mid-2000'sARINC

ATLAS Language

47 year history of what is now SCC20, today

127 year history of what is now the IEEE-SA today

The History of SCC20 book is in

development

Page 10: Chairs Report

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• Revision of IEEE Std 1232-2002

• IEEE Std 1232-2010 was published March 25, 2011

• Revision of IEEE Std 1505-2006

• IEEE Std 1505-2010 was published November 15, 2010

• Revision of IEEE Std 1641-2004

• IEEE Std 1641-2010 was published September 17, 2010

• Revision of IEEE Std 1671-2006

• IEEE Std 1671-2010 was published January 20, 2011

• Trial Use Standard IEEE Std 1636.2-2010 was published November 24, 2010

Recent SCC20 Standards of note

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SCC20 Balloting ActivitiesSince the 11-1 Meeting

• DMC Subcommittee• IEEE Std 1546 (DTIF Users Guide)

• In Reaffirmation Ballot.• Ballot Closes September 25 (11:59PM Eastern).

• TAD Subcommittee• IEEE Std 716 (C/ATLAS)

• Completed Reaffirmation Ballot.• Submitted to RevCom (September SASB meetings).

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SCC20 Standards RelatedSASB Activities Since the 11-1 Meeting

• June 2011 IEEE SASB Meeting• IEEE P1505.3

• PAR: Standard for Universal Test Interface Framework and Pin Configuration for Portable/Bench Top Test Requirements

• IEEE P1671.0• PAR: Guide for the Use of Automatic Test Equipment Markup Language

(ATML); the IEEE-1671 Family of Standards

• IEEE P1871.1• PAR: Recommended Practice for Using IEEE 1671.2 Instrument Description

Templates

• IEEE P1871.2• PAR : Recommended Practice for IEEE 1671 Test Equipment Templates

• September 2011 IEEE SASB Meeting• IEEE P1693

• PAR: Standard for Modular Interconnect Packaging for Scalable Systems

• IEEE Std 716• Reaffirmation of the 716-1995 Standard (C/ATLAS)

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SCC20 Related SASB Activities Since the 11-1 Meeting

• June 2011 IEEE SASB Meeting• SCC20’s Annual Report was Presented to the Standards Board

• The Annual Report was Accepted and Approved by the Standards Board

• SCC20’s updated Operating Procedures were reviewed, edited and ultimately approved by AudCom.

• Approved by the Standards Board.

• September 2011 IEEE SASB Meeting• No Activity

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• Initiated in April 2010 to investigate the possibility of there being a common set of XML elements that could be shared between:

• ATML (IEEE-1671 family)

• SIMICA (IEEE-1636 family)

• AI-ESTATE (IEEE-1232)

• STD (IEEE-1641)

• The Task Group has not officially started.• Due to the workload of committee task group members, I have not

“started the clock”.

• Task Groups are to finish in 6 months or less

• Output would be a recommendation, and possibly a draft PAR.

SCC20 Related Activities SCC20 Common Task Group

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• IEEE/IEC Dual Logo Adoption Requests • IEEE Std 1232-2010

• IEEE Std 1445-1998

• IEEE Std 1641-2010

• IEEE Std 1671-2010

• SCC20 Activities Report• An SCC20 Activities Report was created August 16, 2011.

• Dr. Osamu Karatsu (IEC TC93) and Jodi Haasz (IEEE-SA) presented the report at the IEC TC 93 plenary September 7, 2011 in Seoul, South Korea.

• I participated via Teleconference for both the TC93 WG meeting on the 6th, and the Plenary on the 7th of September.

SCC20 Related IEC TC93 ActivitiesSince the 11-1 Meeting

Page 16: Chairs Report

SCC20 Related Activities Since the 11-1 Meeting

• ATML Test Configuration (P1671.4)• Revision of IEEE Std 1671.4-2007

• Initially Trial-Use, Transitioned to Full-Use

• Document Draft 3, XML Schema Version 3.00

• Working Group vote and start IEEE-SA ballot process in October

• SIMICA Test Results (P1636.1)• Revision of IEEE Std 1636.1-2007

• Is still Trial-Use

• Document Draft 2, XML Schema Version 4.04

• SIMICA Common (P1636.99)• New Standard based upon IEEE Std 1636.2-2010 Material

• Document Draft 1, XML Schema Version 2.00

• Created MAI XML schema utilizing “this” SIMICA Common

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Page 17: Chairs Report

SCC20 Related Activities Since the 11-1 Meeting

• SCC20 Meeting Planning• SCC20 12-1 Meeting.

• Details will be provided when we get to Agenda Item 8.2.

• Updated Subcommittee P&Ps for each Standards Developing Subcommittee.

• I have Drafts for each of our four Standards Developing Subcommittees.

• Each align with IEEE-SA Working Group P&P Template.

• I have to submit one or more next week for IEEE-SA AudCom Review/Approval

• Updated SCC20 Subcommittee Rosters• Updated and sent to the Co-Chairs for comment/concurrence.

• IEEE Design&Test Magazine• Article on Current Test Standards

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Page 18: Chairs Report

SCC20 Related Activities Since the 11-1 Meeting

• P1851: Trial-Use Standard for Design Criteria of Integrated Sensor-based Test Applications for Household Appliances• Abstract: This trial-use standard defines an integrated

framework of the test software for household appliances. It specifies the test environment, the test information as well as the means to acquire the information (either web services or a data-exchange file).

• C/TT & IM/ST (TC9).

• Telecon’s to Beijing through an IEEE Interpreter• SCC20 Standards and XML Schemas have been exchanged.

• Draft Standard and XML schema have been developed in China• P1851 Draft 1 is available.

• I have provided comments to Ning Hua and Dr. Zhongwen Guo.

• IEEE Ballot process started last week (MEC).

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Page 19: Chairs Report

SCC20 Related Activities Since the 11-1 Meeting

• IEEE Std 315

19

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IEEE-SA Standards Board Meeting Deadlines & Schedules

• 2011• Deadlines for Submission

• February 18 √• May 6 √

• July 29 √

• October 17

• Standards Board Meetings• March 29-31: Piscataway NJ √• June 14-16: Piscataway NJ √

• September 8-10: Seoul S. Korea √

• December 5-7: Piscataway NJ

• 2012• Deadlines for Submission

• February 17

• April 27

• July 20

• October 15

• Standards Board Meetings• March 27-29: Piscataway NJ

• June 6-8: Beijing China

• August 28-30: Piscataway NJ

• December 3-5: Piscataway NJ

Note: NesCom/RevCom interim processing meetings also occur 2-3 times a year. The Standards Board also meets electronically

Page 21: Chairs Report

Misc. IEEE-SA Information

• Editions of Standards• Red-lined versions of Standards• Ballot Comment Resolution

• Resolutions are now:

• Accept

• Revise

• Reject

• Interpretations of Standards• Effective January 2012, the IEEE will not provide Interpretations.

• Interpretation implies the standard is ambiguous, and should be clarified by the sponsor and then voted on.

• This can be in the form of a revision, amendment, or corrigenda.

• Maintenance of IEEE Standards• Changes to Reaffirmation and Stabilization. 21

Page 22: Chairs Report

Misc. IEEE-SA Information

• PARs• Anyone with access to myProject can submit a PAR. The PAR is

automatically placed on the next NesCom agenda.

• Should for example, they indicate SCC20, the SCC20 chair will be asked the following 3 questions (within myProject)

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Misc. IEEE-SA Information

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Misc. IEEE-SA Information

• IEEE-SA eTools

• IEEE• No longer an acronym, now the official name.

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SCC20 Related Web pages

myProject™:

https://development.standards.ieee.org/my-site

SCC20’s Home page: http://grouper.ieee.org/groups/scc20/

Diagnostic & Maintenance Control (DMC): http://grouper.ieee.org/groups/scc20/dmc/

Hardware Interfaces (HI): http://grouper.ieee.org/groups/scc20/HIWG/index.htm

Test and ATS Description (TAD): http://grouper.ieee.org/groups/scc20/td/index.html

Test Information Integration (TII): http://grouper.ieee.org/groups/scc20/tii/