ASMS 2013

MP-379

A Novel Two-Pass Feature

Extraction Workflow for the

Statistical Profiling of Mass

Spectrometric Data

Norton Kitagawa, , Steven M. Fischer,

Joe Roark, Maithilee Samant and

Theodore Sana (Agilent Technologies,

Inc., Santa Clara, CA) and Abhijit Rane

(Persistent Systems Ltd., Pune,

Maharashtra, India)

ASMS 2013 Page 1

A Novel Two-Pass Feature Extraction Workflow for the Statistical Profiling of Mass Spectrometric Data

A Novel Two-Pass Feature Extraction Workflow for the Statistical Profiling of Mass Spectrometric Data

A Novel Two-Pass Feature Extraction Workflow for the Statistical Profiling of Mass Spectrometric Data

ASMS 2013 Page 4