smart & quality memory module
Post on 23-Feb-2016
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Smart & Quality Memory Module
SQRAM Product Line Roadmap & Sales Kit
Embedded Core GroupH2, 2011
DRAM Market Status Worldwide DRAM revenue in 2011 is forecast to
decline to US$35.5 billion, down 11.8% from US$40.3 billion in 2010
Samsung shares over 40% DRAM market
Wide Temperature Module Market
Brand Chip type Cost Availability Lead Time
SQRAM Samsung (sorting) Low Good 2 weeks
Swissbit Samsung (sorting) Median Good 8 weeks
Other TW venders
Promos Wide temperature chip Median Bad 2 weeks
Micron Wide temperature chip High Median 2 weeks
Samsung Memory Chip
Thermal Sensor
30u Golden Finger
10G Anti-Vibration
Developing PlanningAvailable
2011 2012
SO-D
IMM
Lo9n
g-DI
MM
-20 ~ 70°C -20 ~ 85°C -40 ~ 85°C
SQRAM Product Roadmap
SQR-SD3I• SO-DIMM DDR3 RAM
module• Samsung C Die• 1G / 2G / 4G 1333MHz• -40 ~ 85C temperature
SQR-LD3R• Long-DIMM DDR3 RAM
module• Samsung chip• Register support
Q4‘11
SQR-SD3T• SO-DIMM DDR3 RAM
module• Samsung C Die• 1G / 2G / 4G 1333MHz• -40 ~ 85C temperature• Thermal Sensor supportQ4‘11
SQR-SD2I• SO-DIMM DDR2 RAM
module• 128X8 Samsung F Die• 1G / 2G 667MHz• -40 ~ 85C temperature
SQR-LD3E• Long-DIMM DDR3 RAM
module• Samsung chip• ECC support
Q4‘11
SQR-SD2T• SO-DIMM DDR2 RAM
module• 128X8 Samsung F Die• 1G / 2G 667MHz• -40 ~ 85C temperature• Thermal Sensor supportQ4‘11
Moduleware: Thermal Monitor
Functionality: ECC, Register, Thermal Sensor
Chipset: Samsung (Sorting)
Supports Interface: SO-DIMM, LONG-DIMM
DRAM Standard: DDR2 667MHz, DDR3 1333MHz
Temperature: -40C ~ 85C
SQRAM Overview
Longevity: TBD
Module Supplier: Transcend
Regulation: CE, FCC
Industrial Grade Memory Module Testing Process
– Commercial grade tested good modules– Vibration– Sampling test under -40 (ambient) , sampling rate ~10% (MIL-STD-105E)℃– Testing program under +85 (ambient)℃– Chamber -40 ~ +85 (ambient)℃ ℃– Testing Program
Vibration Heater+85C
Chamber-40C
StaticChamber-40~85C
Testing Program
SamplingTesting
RoomTemp.
TestingProgram
Testing Process Description
The purpose of vibration is to reveal the non-robust module
PASS/Fail will be determined by the next 3 testing step (chamber -40 , heater 85 , room temp. test)℃ ℃
Vibration
Condition• 10~50 Hz• 2 mm amplitude• 10G• 2 min/cycle , total 5cycle
Testing Process Description
Sampling test– Sample rate: base on MIL-STD-105E, around 10% per 100 pc module– Criterion: all samples should pass the testing
Test program– test coverage: memtest and RST– 32 / 64 bit kernel
Test time: 15 minutes / 1GB module PASS Criterion: No error bit detected
VibrationChamber-40C
Test Program Function Stuck On test for detecting data bit which always fix high level Stuck Off Test for detecting data bit which always fix low level Random Address Test for random access test Random Data Test for random data write/read verification Address-Line Test for internal address decoder circuit test Walking Bit Test for data line leakage detection One and Zero Data Test for dram hard fail detect test Worse Data Background Test for dram process defect test write
various data ex, 0xaa / 0x55 / 0xcc / 0x33 / 0x99 / 0x66 … Un-cachable Memory Test – Disable the cache of CPU to avoid the
cache interference of memory test
PASS Criterion Display Error Chip / Error Counts / Error Address
and Error Bit
Testing Process Description
85℃ Test program
– test coverage: memtest and RST– 32 / 64 bit kernel
Test time: 15 minutes / 1GB module PASS Criterion: No error bit detected
VibrationChamber-40C
Heater+85C
Testing Process Description
Test time: 235 min / cycle Test cycle: 25 => -40 => 85 => 25℃ ℃ ℃ ℃ Refer to figure1 at page6 PASS/Fail will be determined by the next testing step
(room temp. test)
VibrationChamber-40C
Heater+85C
StaticChamber-40~85C
Static Chamber
Testing Process Description
Room temp. Test program (Transcend owned development) Test time : 6 minutes / 1GB module PASS Criterion: No error bit detected
VibrationChamber-40C
Heater+85C
StaticChamber-40~85C
RoomTemp.
SQRAM ModuleWare
Thermal Monitoring SUSI driver/API required Support by Monitoring utility & SUSIAccess Function
– Configuration: Set warning temperature threshold Set warning response (alarm, hibernate, shutdown)
– User Interface Monitor from system tray Event log
Thank You.
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