building a low cost lisn for emi tests
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V Conferência de Aplicações Industriais
BUILDING A LOW COST LISN FOR EMI TESTS
Presenter: Fernando Soares dos Reis
Pontifical Catholic University of the Rio Grande do SulPontifical Catholic University of the Rio Grande do Sul
BrazilBrazil
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Table of Contents
INTRODUCTION INTRODUCTION
OBJECTIVES OBJECTIVES
TERMS AND DEFINITIONS - EMC, EMITERMS AND DEFINITIONS - EMC, EMI
CONDUCTED EMICONDUCTED EMI
LINE IMPEDANCE STABILIZATION NETWORKLINE IMPEDANCE STABILIZATION NETWORK
PRACTICAL IMPLEMENTATIONPRACTICAL IMPLEMENTATION
EXPERIMENTAL RESULTSEXPERIMENTAL RESULTS
CONCLUSIONSCONCLUSIONS
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Some examples of problems caused by EMI: Some examples of problems caused by EMI:
Pistol Drill may Interfere on TV;Pistol Drill may Interfere on TV; Electronic Ballast's may change the TV Electronic Ballast's may change the TV channel;channel; Switching Inductive Load may generate Switching Inductive Load may generate noise in Radios;noise in Radios;
Necessity of accordance with Standards...Necessity of accordance with Standards...
INTRODUCTIONINTRODUCTION
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The simulation toolThe simulation tool
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SSimulation imulation TToolool Results Results
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Experimental ResultsExperimental Results
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In this paper will be presented a methodology for In this paper will be presented a methodology for implementation of a Line Impedance Stabilization implementation of a Line Impedance Stabilization Network - LISN, symmetric commutable, in Network - LISN, symmetric commutable, in accordance with the specifications of the accordance with the specifications of the Normative IEC CISPR 16-1, using easily acquirable Normative IEC CISPR 16-1, using easily acquirable components in the electro-electronic stores. The components in the electro-electronic stores. The Line Impedance Stabilization Network is used for Line Impedance Stabilization Network is used for conducted EMI tests in equipment’s witch current conducted EMI tests in equipment’s witch current is not above 16 A.is not above 16 A.
OBJECTIVESOBJECTIVES
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TERMS AND DEFINITIONSTERMS AND DEFINITIONS
Electromagnetic Compatibility - EMC:Electromagnetic Compatibility - EMC:
• It´s the characteristic presented by an It´s the characteristic presented by an equipment, or system, working equipment, or system, working satisfactorily, in an electromagnetic satisfactorily, in an electromagnetic environment without causing or environment without causing or suffering unacceptable degradation in suffering unacceptable degradation in its individually designed function.its individually designed function.
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COMMUNICATIONCOMMUNICATION ENVIRONMENTENVIRONMENT
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Electromagnetic Interference – EMIElectromagnetic Interference – EMI
Any electromagnetic disturbance that Any electromagnetic disturbance that interrupts, obstructs, or otherwise degrades or interrupts, obstructs, or otherwise degrades or limits the effective performance of limits the effective performance of electronics/electrical equipment. It can be electronics/electrical equipment. It can be induced intentionally, as in some forms of induced intentionally, as in some forms of electronic warfare, or unintentionally, as a electronic warfare, or unintentionally, as a result of spurious emissions and responses, result of spurious emissions and responses, intermodulation products, and the like. Also intermodulation products, and the like. Also called radio frequency interference RFI.called radio frequency interference RFI.
TERMS AND DEFINITIONSTERMS AND DEFINITIONS
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INDUSTRIAL ENVIRONMENTINDUSTRIAL ENVIRONMENT
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By Globalization´s By Globalization´s Highway...Highway...International Rules...International Rules...
ALCAALCA
MERCOSULMERCOSUL
EUROPEAN UNIONEUROPEAN UNION
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IECIEC - International Electrotechnical Commission; - International Electrotechnical Commission; CISPRCISPR - International Special Committee on - International Special Committee on
Radio Interference;Radio Interference; CENELECCENELEC - Committee for Electrotechnical - Committee for Electrotechnical
StandardizationStandardization;; These organizations prepares and These organizations prepares and
publishes international standards for all electrical, publishes international standards for all electrical, electronic and related technologies;electronic and related technologies;
GLOBALIZATIONSGLOBALIZATIONS
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CONSUMERS REQUIREMENTSCONSUMERS REQUIREMENTS
ELECTRONICS LOADSELECTRONICS LOADS
IN THE LAST YEARS THE ELECTRONIC LOADS GROW IN THE LAST YEARS THE ELECTRONIC LOADS GROW
UP OVER THE WORLDUP OVER THE WORLD
BRAZIL WAS NOT AN EXEPTION AT THIS PROCESSBRAZIL WAS NOT AN EXEPTION AT THIS PROCESS
IN THE LAST YEARS THE ELECTRONIC LOADS GROW IN THE LAST YEARS THE ELECTRONIC LOADS GROW
UP OVER THE WORLDUP OVER THE WORLD
BRAZIL WAS NOT AN EXEPTION AT THIS PROCESSBRAZIL WAS NOT AN EXEPTION AT THIS PROCESS
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ELECTROMAGNETIC COMPATIBILITY
EMISSION SUSCEPTIBILITY
CONDUCTED IRRADIATED CONDUCTED IRRADIATED
ELECTROSTATIC
HARMONICSPOWER
FLUTUATION RADIO-INTERFERENCE
Basic Categories for EMCBasic Categories for EMC
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Difficulties for realization of the testsDifficulties for realization of the tests
Few test Facilities (in Brazil and South America);Few test Facilities (in Brazil and South America);
Test apparatus are very expensive;Test apparatus are very expensive;
Technical Capacity;Technical Capacity;
Standards Interpretation;Standards Interpretation;
Conducted EMI testConducted EMI test
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EMCEMC
Interference MeasurerEMI Receptor
10 kHz to 30 MHzAccording to VDE 0871
Uinter..
LISN
450 kHz a 30 MHzAccording to FCC 15
Telescopic AntennaLoop Antenna
Dipole Antenna
30 to 1000 MHz
Interferencesupply
According to VDE 0871 e FCC
10 kHz to 30 MHzAccording to VDE 0871
Not Required by VDE
Einter..
Hinter..
Pinter..
Iinter...
Line Impedance Stabilization Network
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2 X
E U T Antenna
3 XX
Open Area Test SiteOpen Area Test Site
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Ground Plane
EUT Antenna4 m
1 m
3 m10 m30 m
1 m
EMI
Receiver
100 m
IRRADIATED EMI MEASURING PROCEEDINGSIRRADIATED EMI MEASURING PROCEEDINGS
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CISPR 11CISPR 11
LIMIT STANDARDSLIMIT STANDARDS
FCC 15FCC 15
8080
7070
6060
Limit ValueLimit Valueclass Aclass A
class Bclass B
7070
6060
dBdB
µVµV
100100
9090
MHzMHz0.010.01 0.10.1 11 1010 30301.61.60.450.45
5050
4040
3030
4848
Limit ValueLimit Value
Class AClass A. A device that is marketed for use in a commercial, . A device that is marketed for use in a commercial, industrial or business environment; industrial or business environment;
Class BClass B A device that is marketed for use in a residential A device that is marketed for use in a residential environment notwithstanding use in commercial, business and environment notwithstanding use in commercial, business and industrial environments;industrial environments;
0.15 0.5 30 MHz
100
90
80
70
60
50
40
300.9 10
73
6066
79
56
Limit Value Limit Value Quasi-peak (class A)Quasi-peak (class A)
dBµV
Quasi-peak (class B)Quasi-peak (class B)
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It is the part of the electromagnetic interference It is the part of the electromagnetic interference
that flows by power cords.that flows by power cords.
This kind of interference can be propagated in:This kind of interference can be propagated in:
Differential Mode (DM) or inDifferential Mode (DM) or in Common Mode (CM)Common Mode (CM)
CONDUCTED EMICONDUCTED EMI
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EquipmentEquipment
ZZ LISNLISN
PhasePhase
NeutralNeutral
ii CDMCDM
CONDUCTED EMI IN CONDUCTED EMI IN DIFERENTIAL MODEDIFERENTIAL MODE
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EquipmentEquipment
ZZ LISNLISN iiCCMCCM
CONDUCTED EMI IN CONDUCTED EMI IN COMMON MODECOMMON MODE
PhasePhase
NeutralNeutral
Ground - CommonGround - CommonParasitic CapacitorsParasitic Capacitors
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Conductive Surface Connected to GndConductive Surface Connected to Gnd
Equipment Under TestEquipment Under Test
LISNLISN
EMI ReceiverEMI Receiver
80 cm80 cm8080
cmcm
4040cmcm
Equipment Under Test (EUT) and Equipment Under Test (EUT) and Measurements Apparatus Measurements Apparatus
LABORATORY TESTS FACILITIESLABORATORY TESTS FACILITIES
Layout for conducted emissions testsLayout for conducted emissions tests
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EMI ReceptorEMI Receptor
80 cm80 cm8080
cmcm
4040cmcm
Frequency (MHz)Frequency (MHz)
Imp
edan
ce
Imp
edan
ce
± 20 % Maximum Tolerance± 20 % Maximum Tolerance
kHz
10
10000
5,4
50
20
80
150
300
800
7,3
21
33
43
49
LISNLISN Fre. Imp.
50µH
50
5
SIMULATION OF THE SIMULATION OF THE LISN CHARACTERISTICSLISN CHARACTERISTICS
CISPR 16
LISNLISN
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IMPLEMENTED LISN IMPLEMENTED LISN
EMI
Reveiver
To The EUT
4 µF 8 µF250 nF50 µH
Gnd
4 µF8 µF
250 nF50 µH
50
Phase
Mains
Neutral
To The EUT
1 k
1 k
250 µH
5
5
250 µH
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Inductor of the 50 Inductor of the 50 HH
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Inductor of the 50 Inductor of the 50 HH
The inductor is a coil with 35 turns, shaping one only layer of 6mm enameled wire. The step of this coil is 8 mm, rolled in an isolating core of (150 mm) 130 mm or 5 inches x 280 mm as the IEC CISPR 16-1 regulations indicates. The wire diameter is the dimension that considers to minimize the inductors resistive component. However, the coil built was fashioned using a 4 mm wire, because the current from the test equipment's is under 5A.
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Inductor of the 50 Inductor of the 50 HH
The step rolling control of the inductor was made using a 4 mm fishing string (nylon) between each espire.
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Inductor of the 50 Inductor of the 50 HH
To suppress internal resonance in this inductor the IEC CISPR 16-1 regulation, establishes that 430 ± 10% being connected between the espires 4 and 8, 12 and 16, 20 and 24 and 26 and 32 as showed.
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Inductor of the 50 Inductor of the 50 HH
To obtain a 430 resistance, which is not commercial it was associated in parallel a
470 resistor with another of 4700 .
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LISN Assembled on a PC RackLISN Assembled on a PC Rack
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EXPERIMENTAL RESULTSEXPERIMENTAL RESULTSLISN - EXPERIMENTAL RESULTSLISN - EXPERIMENTAL RESULTS
Regulation
Phase
Neuter
Zmin
Zmax
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The mainly point of this work is in the fact The mainly point of this work is in the fact
of making more accessible the EMI tests of making more accessible the EMI tests
realization, diminishing the assembling realization, diminishing the assembling
costs in EMI test facilities, reflecting even costs in EMI test facilities, reflecting even
by academic or industrial environment.by academic or industrial environment.
The mainly point of this work is in the fact The mainly point of this work is in the fact
of making more accessible the EMI tests of making more accessible the EMI tests
realization, diminishing the assembling realization, diminishing the assembling
costs in EMI test facilities, reflecting even costs in EMI test facilities, reflecting even
by academic or industrial environment.by academic or industrial environment.
CONCLUSIONSCONCLUSIONS
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The components utilized to build the The components utilized to build the
Artificial Network are easily acquired, Artificial Network are easily acquired,
because they are not specific for this usage.because they are not specific for this usage.
The only problem to use Artificial Networks The only problem to use Artificial Networks
is the calibration factor. is the calibration factor.
The components utilized to build the The components utilized to build the
Artificial Network are easily acquired, Artificial Network are easily acquired,
because they are not specific for this usage.because they are not specific for this usage.
The only problem to use Artificial Networks The only problem to use Artificial Networks
is the calibration factor. is the calibration factor.
CONCLUSIONSCONCLUSIONS
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The End
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