a novel approach on gate delay transition based path delay fault model

33
A NOVEL APPROACH ON GATE DELAY TRANSITION BASED PATH DELAY FAULT MODEL 4 June, 2014 MADHA ENGINEERING COLLEGE By V.Srividhya Reg. No: 211112419007 ME VLSI Design, Madha Engineering College, Kundrathur. Guided by, Mrs. P. Pattunarajam. M.Tech.,(Ph.D)., Associate Professor ECE Department Madha Engineering College, Kundrathur 1

Upload: sriece2007

Post on 20-Jul-2015

97 views

Category:

Engineering


2 download

TRANSCRIPT

A NOVEL APPROACH ON GATE DELAY

TRANSITION BASED PATH DELAY FAULT

MODEL

4 June, 2014 MADHA ENGINEERING COLLEGE

By

V.Srividhya

Reg. No: 211112419007

ME – VLSI Design,

Madha Engineering College, Kundrathur.

Guided by,

Mrs. P. Pattunarajam. M.Tech.,(Ph.D).,

Associate Professor

ECE Department

Madha Engineering College, Kundrathur

1

OBJECTIVE

4 June, 2014 MADHA ENGINEERING COLLEGE

To check circuit delay

failure

Probability computation

Gate delay and

switching activity

estimation

Checking path

correlation

2

INTRODUCTION

Testing consumes more power and time

VLSI suffers from 3-D issue

New path delay model had been done

Path delay faults are identified

4 June, 2014 MADHA ENGINEERING COLLEGE

VLSI TECHNOLOGY

TIME

POWER

AREA

3

FAULT MODEL

4 June, 2014 MADHA ENGINEERING COLLEGE

Path delay fault model

Clock = 7ns.

P1=>2ns

P2=>4ns

P3=>6ns

SS’

dp2<clk

dp3<clk

dp1<clk

4

EXISTING BIST ARCHITECTURE

4 June, 2014 MADHA ENGINEERING COLLEGE 5

EXISTING METHOD

4 June, 2014 MADHA ENGINEERING COLLEGE

CIRCUIT UNDER TEST

TOP LONGEST

SEGMENT COVERAGE

HEURISTICS

UPPER AND LOWER BOUND

6

PROPOSED WORK

Meandelaycomputation

Test vectorgeneration(Twopatterntest)

Circuitbehavioranalysisbased onanalyticalapproach

Analyticalapproach onfaulty circuit

Comparisonof meandelay andprobabilitywith andwithoutfault

4 June, 2014 MADHA ENGINEERING COLLEGE 7

GATE DELAY COMPUTATION

4 June, 2014 MADHA ENGINEERING COLLEGE

Input and output capacitance of each gate in ISCAS’85 c17

benchmark circuit

cin = (cout * gi) / fcap

gi logical effort, fcap product of logical, electrical and

branch effort

Gate delay = f + p + q

f = g * h , h = cout/cin

h electrical effort, p parasitic effort, q non-ideal delay

8

GATE DELAY COMPUTATION

4 June, 2014 MADHA ENGINEERING COLLEGE 9

PATHS IN ISCAS’c17 BENCHMARK CIRCUIT

P1 – n1, n10, n22

P2 – n3, n11, n16, n22

P3 – n6, n11, n16, n23

P4 – n11, n19, n23

P5 – n2, n16, n22

P6 – n2, n16, n23

P7 – n7, n19, n23

4 June, 2014 MADHA ENGINEERING COLLEGE 10

GATE DELAY VALUES

4 June, 2014 MADHA ENGINEERING COLLEGE

PATH MEAN DELAY

P1 9.615

P2 8.434

P3 8.434

P4 8.434

P5 8.813

P6 8.813

P7 8.813

11

TWO PATTERN INPUT VECTOR

GENERATION

4 June, 2014 MADHA ENGINEERING COLLEGE

1 2 3 4 5

0 0 1 1 0

1 2 3 4 5

1 1 1 0 0

CIRCUIT

UNDER

TEST

LFSR

LFSR

Clock

V1

V2

Td

12

GENERATED TWO PATTERN INPUTS

4 June, 2014 MADHA ENGINEERING COLLEGE

S.NoInitialization

pattern

Propagation

pattern

Output1swa

n22

Output 2 swa

n23

1 11100 00011 1 0

2 11110 10001 1 1

3 11111 11000 2 1

4 01111 10010 4 3

5 00111 11110 5 3

6 10011 11111 6 4

7 11001 01111 8 5

8 01100 00111 9 6

9 10110 10011 9 7

10 01101 11001 10 7

13

SWITCHING ACTIVITY ESTIMATION USING

ModelSim Altera 6.5e

4 June, 2014 MADHA ENGINEERING COLLEGE

Switching

Activity of

each net

14

PROBABILITY CALCULATION

Normal distribution is used

Advantage of normal distribution is, it is standard

distribution to compute probability of particular area

Mean delay=m sum of gate delay and switching

activity of particular path

Standard deviation=s

Random variable=x 110% of longest path delay

Normal region=(x-m)/s

4 June, 2014 MADHA ENGINEERING COLLEGE 15

PROBABILITY CALCULATION OF TWO

PATHS

Normal distribution is used

If two paths are normally distributed, then the following

formula applied for joint probability

Z=X+Y

Mean (Z) = Mean(X) + Mean(Y)

Var (Z) = Var(X) + Var(Y) + 2cov(X, Y)

The delay of two path is denoted as d2(p1p2)

4 June, 2014 MADHA ENGINEERING COLLEGE 16

PROBABILITY CALCULATION OF THREE

PATHS

Max(d2(p1p2)+d2(p1p3)-d1(p1),d2(p1p2)+d2(p2p3)-

d1(p2),d2(p1p3)+d2(p2p3)-

d1(p3))<=d3(p1p2p3)<=Min(d2(p1p2),d2(p1p3),d2(p2p3))

The max value upper bound

The min value lower bound

The average of the upper and lower bound is the probability

of three paths.

4 June, 2014 MADHA ENGINEERING COLLEGE 17

PROBABILITY CALCULATION FOR MORE THAN

3 PATHS

4 June, 2014 MADHA ENGINEERING COLLEGE 18

CALCULATION EXAMPLE

4 June, 2014 MADHA ENGINEERING COLLEGE

d4(p1p2p3p4) = d3(pLp3p4)

d3(pLp3p4) =Max(d2(pLp3)+d2(pLp4)-d1(pL),d2(pLp3)+d2(p3p4)-

d1(p3),d2(pLp4)+d2(p3p4)-d1(p4) <= d3(pLp3p4) <=

Min(d2(pLp3),d2(pLp4),d2(p3p4))

d1(pL) = d2(p1p2)

d2(pLp3) = d3(p1p2p3)

d2(pLp4) = d3(p1p2p4)

19

PRACTICAL COMPUTED VALUES

In this proposed work, the computed values for

ISCAS’85 c17 benchmark circuit are as follows,

X Target clock = 110% of 17.9400 = 19.734

X for two paths 2*19.734 = 39.468

4 June, 2014 MADHA ENGINEERING COLLEGE 20

COMPARISON OF FAULTLESS AND FAULTY

CIRCUIT

4 June, 2014 MADHA ENGINEERING COLLEGE

Faultless Faulty

21

MATHEMATICAL ANALYSIS FROM

MATLAB R2010a

4 June, 2014 MADHA ENGINEERING COLLEGE 22

MATHEMATICAL ANALYSIS FROM

MATLAB R2010a (Cont….)

4 June, 2014 MADHA ENGINEERING COLLEGE 23

MATHEMATICAL ANALYSIS FROM

MATLAB R2010a (Cont….)

4 June, 2014 MADHA ENGINEERING COLLEGE

Path index MeanStandard

deviationProbability Clock (X) ns

P1P2 32.9031 14.4177 0.6756

39.4680

P1P3 31.4031 12.8141 0.7354

P2P3 31.2200 12.7225 0.7416

P1P4 29.6531 11.6957 0.7993

P2P4 29.4700 11.5999 0.8056

P4P5 31.6500 12.7710 0.7451

P5P6 33.8800 14.5263 0.6498

P6P7 29.5466 11.1940 0.8123

P1P6 32.4831 13.5198 0.6973

P1P5 34.4831 15.4774 0.6263

24

MATHEMATICAL ANALYSIS FROM

MATLAB R2010a (Cont….)

4 June, 2014 MADHA ENGINEERING COLLEGE

Path index

Probability

(P1P2P3P4P5P6P7)

without fault

Probability

(P1P2P3P4P5P6P7)

with fault

P1

0.4892

0.5425

P2 0.5665

P3 0.6133

P4 0.5320

P5 0.6236

P6 0.4353

P7 0.4734

25

GRAPHICAL RESULTS FROM MATLAB

R2010a

4 June, 2014 MADHA ENGINEERING COLLEGE 26

GRAPHICAL RESULTS FROM MATLAB

R2010a (Cont….)

4 June, 2014 MADHA ENGINEERING COLLEGE 27

REPORT FROM QUARTUS II 10.0 (CYCLONE II)

METHOD POWER (mW)

Phase I Transition fault model 29.68

Phase II Path Delay fault model 30.26

4 June, 2014 MADHA ENGINEERING COLLEGE

I/O Pin

assignments

11/89

(12%)

28

OVERALL RESULTS FROM ALL TOOLS

Benchmark

Name

Power

(mW)

CPU Time

(seconds)

I/O Pin

required

Target

Clock(Units)

Target Clock

for 2

paths(Units)

ISCAS’85

c17

30.26 1.1663 11/89(12%) 19.734 39.4680

4 June, 2014 MADHA ENGINEERING COLLEGE 29

CONCLUSION

The probability value depends on the switching activity

of the circuit

The circuit switching activity in turn depends on the

input vectors.

If the probability is high, the path delay will not exceed

the maximum delay

If the probability is low, the path delay will exceed the

maximum delay.

4 June, 2014 MADHA ENGINEERING COLLEGE 30

FUTURE WORK

4 June, 2014 MADHA ENGINEERING COLLEGE

In future work, interconnect delay also considered with

gate delay, switching activity of the nets with primary

input vectors so as to achieve accurate path delay for

small and large circuits.

31

REFERENCES

[1] Alok S. Doshi and Anand S(2008), “Test Pattern Generator for Built-in Self Test using Spectral Methods ” , Mudlapur

Auburn University Dept. of Electrical and Computer Engineering, Auburn, AL, USA doshias.

[2] Hongliang Chang and Sachin S. Sapatnekar(2003), “Statistical Timing Analysis Under Spatial Correlations,” Fellow,

IEEE.”Computer Aided Design of integrated circuits and systems, IEEE Transactions on vol 24, no. 9.

[3] lrith Pomeranz and Sudhakar M. Reddy(Jan.1996), “On the number of tests to delect all path delay faults in combinational

logic circuits, “IEEE transactions on computers, vol. 45, No. 1.

[4] Jing-Jia Liou, Angela Krstic, Li-C. Wang and Kwang-Ting Cheng(Jun 2002), “False-Path-Aware Statistical Timing

Analysis and Efficient Path Selection for Delay Testing and Timing Validation,” Electrical and Computer Engineering

Department,University of California, Santa Barbara., IEEE 39th proceedings.

[5] Li-C. Wang, Jing-Jia Liou and Kwang-Ting Cheng(Nov 2004), “Critical Path Selection for Delay Fault Testing Based

Upon a Statistical Timing Model,” IEEE transactions on computer-aided design of integrated circuits and systems, vol. 23,

no. 11,.

[6] Vladimir Zolotov, Jinjun Xiong, Hanif Fatemi,and Chandu Visweswariah(May 2010), “Statistical Path Selection for At-

Speed Test,” IEEE transactions on computer-aided design of integrated circuits and systems, vol. 29, no. 5.

[7] W.B.Jone, W.S.Yeh and S.R.Das(2000),”An Adaptive Path Selection Method for Delay Testing”, IEEE transactions on

very large scale integration system, volume 50, issue 5.

[8] Wing Ning Li, Sudhakar M. Reddy, Sartaj Sahni(Aug 2002), “On Path Selection In Combinational Logic Circuits,” IEEE

transactions in computer aided design of integrated circuits and systems, vol 8, no. 1.

[9] Wangqi Qiu D. M. H. Walker, “An Efficient Algorithm for Finding the K Longest Testable Paths Through Each Gate in a

Combinational Circuit,” Department of Computer ScienceTexas A&M University, IEEE proceedings, volume 1.

[10] Xiang Lu, Zhuo Li, Wangqi Qiu, D. M. H. Walker and Weiping Shi, “Longest Path Selection for Delay Test under Process

Variation,” Texas A&M University, College Station, Texas 77843, IEEE transactions on vol 24, no. 12.

[11] Zijian He, Tao Lv, Huawei Li and Xiaowei Li(Jul 2013), “Test Path Selection for Capturing Delay Failures Under

Statistical Timing Model”IEEE transactions on very large scale integration (VLSI) systems, vol. 21, No. 7.

4 June, 2014 MADHA ENGINEERING COLLEGE 32

4 June, 2014 MADHA ENGINEERING COLLEGE 33