程式化應用技術研討會 - keysightliterature.cdn.keysight.com/litweb/pdf/5989-4582zha.pdf ·...

Agilent 8960 User Club---程式化應用技術研討會

2006 年 1 月 16-18 日

研討會時程

13:00-13:30 來賓報到享用小茶點

13:30-14:00 What’s new for the Agilent 8960 (E5515C) Wireless Communications Test Set

14:00-15:00 Agilent E1963A W-CDMA Test Application Programming

15:00-15:20 午茶時間輕鬆一下

15:20-16:20 Mobile Calibration and Multiple-Instance Testing Concept

16:20-17:20 New Calibration Techniques (PAvT & DPOW)

1

Wireless Division

What’s for the 8960 (E5515C)

Wireless Communications Test Set !!!!!!

Dec 2005

8960 VIPDec 2005

Agilent Restricted Page 2

One agile platform, many optimized solutions

HSDPA

2

8960 VIPDec 2005


Agilent’s 8960

GSM/GPRS

IS-95/AMPS

cdma2000

TIA/EIA-136

1xEV-DO

EGPRS

W-CDMA

HSDPA

8960 VIPDec 2005

Agilent Restricted

Basics of the 8960

E5515C chassis Firmware:•Test Applications•Lab Applications

Hardware options:•002 Second RF Source•003 Link subsystem•004 Digital Bus (Fading)

Related PC Software:•Wireless Test Manager•Wireless Protocol Advisor•Baseband Studio

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8960 VIPDec 2005

Agilent Restricted

Latest 8960 Updates

8960 VIPDec 2005


Latest Features of 8960Latest Features of 8960’’s Features s Features (including (including Two Cells Testing using Two 8960 test setsTwo Cells Testing using Two 8960 test sets))

HSDPA – Latest technology is now available !!GSM/GPRS/EGPRS –

(a) Digital ORFS for faster speed(b) Demonstrating how voice and data work at the same

time. (DTM-Dual transfer mode).(c) Demonstrating a handover from CELL to CELL

(Using two 8960s)EGPRS – Phase and Amplitude vs. Time (Polar Cal)

W-CDMA – Demonstrating connection of one video phone to another video phone through an emulated network (lots of interoperability issues between phones – mostly caused by protocol problems)(Using two 8960s) {Note: was first released in late 2004}

cdma2000/1x-EVDO – (a) Demonstrating the test for handover from cdma2000 to 1x-EVDO (hybrid mode) (Using two 8960s)

(b) Authentication & Advanced AMPS (c) Vocoder aimed at OnStar application(d) MEID & BC0 added

4

8960 VIPDec 2005


Products OverviewAGENDA:• GSM/ (E)GPRS products• cdma2000 products • W-CDMA/HSDPA products• Wireless Test Manager• Agilent/Anite Conformance test• Online Resources• Q&A

Test ApplicationsTest ApplicationsE1962B cdma2000 – enhanced

Opt 401 -- (1x Rel. A)Opt 402 -- (Advanced AMPS) -NEWOpt 403 -- (Authentication) -NEW

E1963A W-CDMA – enhancedOpt 401 -- (Video Testing)Opt 403 -- (HSDPA) -NEW

E1968A GSM/(E) GPRS – enhancedOpt 410 -- (PAvT) -NEW

E1987A Fast Switch TAE1991B TA SuiteE1993A UMTS TA SuiteE1996A - cdma2000/1xEV-DO TA suite -NEW

Lab ApplicationsLab ApplicationsE6701D GSM/GPRSE6704A EGPRS - enhancedE6702B cdma2000 – enhancedE6703C W-CDMA/ HSDPA – enhanced & NEWE6706A 1xEV-DOE6719B LA SuiteE6717A UMTS LA SuiteE6785C Fast Switch LAE6716A - cdma2000/1xEV-DO LA suite -NEW

Wireless Test ManagerWireless Test ManagerE6560C cdma2000/IS95/AMPN5880A cdma2000/IS95/AMPS (enhanced) -NEWE6562C W-CDMA N5882A W-CDMA (enhanced) -NEWE6566C GSM/GPRS/EGPRS E6568C GSM/GPRS/EGPRS/W-CDMA -NEWE6564C 1xEV-DO -NEWN5884C 1xEV-DO (enhanced) -NEWE6569C WTM SuiteE6571C Run-time license

Overview of 8960 GSM/(E) GPRS Enhancements

E1968A GSM/GPRS/EGPRS Test Application

E6701D GSM/GPRS Lab Application

E6704A EGPRS Lab Application

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8960 VIPDec 2005


Summary of latest Features of GSM/GPRS/EGPRS Summary of latest Features of GSM/GPRS/EGPRS

GSM/GPRS/EGPRS –(a) Digital ORFS for faster speed(b) DTM-Dual transfer mode(c) Handover from CELL to CELL

EGPRS –(a) Phase and Amplitude vs. Time (PAvT)

8960 VIPDec 2005


Digital ORFS (Output RF Spectrum) measurement

Key Signal Processing Steps:1) 30 kHz bandwidth filtering2) Power detection3) Logging

Implementation: hardware

Speed: Influenced by receiver hardware retuning for each ORFS frequency offset

Dynamic range:• Expected power > 10dBm Better• Expected power ~ Low Good

Key Signal Processing Steps:1) 30 kHz bandwidth filtering2) Power detection3) Logging

Implementation: software

Speed: No receiver retuning - all ORFS offset freqs computed w/single acquisition

Dynamic range:• Expected power > 10dBm Good• Expected power ~ Low Better

Value: Provides speed-optimized alternative ORFS measurement

SAME

Existing Analogue ORFS Meas NEW Digital ORFS Meas

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8960 VIPDec 2005


Speed Improvements - Modulation

ORFS due to Modulation test time is reduced with both old and new measurement HWBiggest improvement will be with high offset count and new instrument HW

Old HW with SN < GB45070000

New HW with SN => GB45070000

Test Time (Modulation)

0

0.2

0.4

0.6

0.8

1

1.2

1.4

1.6

2 4 6 8 10 12 14 16 18 20 22

Number of Offsets

Tim

e (s

) 20

burs

t Avg

Analog ModulationDigital Mod (old HW)Digital Mod (new HW)

8960 VIPDec 2005


Speed Improvements - Switching

ORFS due to Switching test time is dramatically reduced with new measurement HWWith Digital ORFS and OLD HW some combinations of offsets and burst averaging can result in slightly longer test times.

Old HW with SN < GB45070000

New HW with SN => GB45070000

Test Time (Switching)

0

0.2

0.4

0.6

0.8

1

1.2

2 4 6 8

Number of Offsets

Tim

e (s

) 20

burs

t Avg

Analog SwitchDig Switch (Old HW)Dig Switch (New HW)

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8960 VIPDec 2005


Additional Speed Information

Digital ORFS Switching speed can be further improved by averaging 2 contiguous uplink bursts (further 30% faster)Recommended only with most recent HW, or old HW with upgrades

Simultaneous Modulation and Switching testingValues below assume 20 burst average

7.5x2.0x228

4.0x1.3x442.5x1.1x22

New HardwareOld HardwareModulation offsetsSwitching offsetsTest time improvement

8960 VIPDec 2005


Instrument Hardware Requirements

Digital ORFS will work with all instruments which are already E1968A capable Fastest measurement speed will be with most recent HW (installed as standard from SN GB45070000)Older instruments can be upgraded with E5515CU-185 or E5515CU-285

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8960 VIPDec 2005


Release Information

The first revision of E1968A which supports Digital ORFS is A.06.xx released End Aug 2005Existing E1968A license holders can download A.06.xx and obtain Digital ORFS for FREE. A.06.xx also includes a new optional PAvT measurement. An additional E1968A-410 license to use PAvT is available to purchaseDefault operation for A.06.xx will be Analogue ORFS, one additional GPIB command will enable Digital ORFSBoth Analogue and Digital options are selectable along with AUTOAUTO will select the most suitable (fastest) test method based on offset/average count and hardware installed.Digital ORFS will be added to E6701D in January 2006 and E6701E (pre-releases) from September 2005

8960 VIPDec 2005


Dual Transfer Mode (DTM)

DTM = Simultaneous GSM Voice + (E)GPRS DataPS and CS connections must both be on the same ARFCN and in contiguous timeslots in both uplink and downlinkNo requests for single slot operation - Standards allow for Half rate voice and data sharing a single slot

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8960 VIPDec 2005


DTM in E6701EDTM ON/OFF• With DTM on, test:

Correct implementation of additional/new signallingDifferent RF conditions

• Force DTM off to test:Suspend/Resume when the MS is in a non-DTM

supported cellInteraction with other Services/Features• DTM can be used with all existing Speech Codecs - AFS,

FR, EFR, AHS, HR• SMS, MMS, Wap-Push etc.

8960 VIPDec 2005


DTM in E6701E – Connection types

Connection Type AutoPRBS GSM voice + Real life IP data to/from external serversPRBS GSM voice + PING

Connection Type ETSI-A, B (Ack and Un-Ack), SRBPRBS GSM voice + continuous manufacturing style

connection (8PSK or GMSK)Connection Type BLER

PBRS GSM Voice + BLER Ack/Nack’s (GMSK only)Available even when no manufacturing connection types are

supported by the mobile22

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8960 VIPDec 2005


Two-Cell Handover (Handoff) and Cell Reselection

E6701E pre-release GSM/GPRS Lab ApplicationJune 2005

Also applies to E6704A EGPRS LA extension if installed

8960 VIPDec 2005


Two-Cell Handover and Cell Reselection• One of the most common cause of “dropped” mobile voice calls and data

connections is while transitioning between two cells resulting in:

• Reduced revenue for networks

• Customer dissatisfaction and frustration

• Valuable network resources are required

• Multiple handovers = poor network efficiency

• The only current method for testing Handovers and Cell Reselection is with costly conformance test systems

• Significant number of conformance tests require more than 1 cell

• Bench-top 8960 pre-conformance will free up valuable conformance system resources

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8960 VIPDec 2005


Two-Cell test scenarios• Idle mode cell selection

• Idle mode cell reselection – MS initiated

• Idle mode cell reselection – Network initiated

• (E)GPRS packet transfer mode cell reselection – MS initiated

• (E)GPRS packet transfer mode cell reselection – Network initiated

• GSM dedicated voice handover – Network initiated

Unsynchronised, Synchronised, Pseudo – Synchronised

• GSM Circuit Switched Data (CSD) handover – Network initiated

• Dual Transfer Mode (DTM) handover – Network initiated

8960 VIPDec 2005


Measurements Reports and ThroughputMeasurement Reports• Measurement reports are available for

whichever instrument the device is camped/attached to

• Report values will not be used by the system to initiate handovers

RF Measurements• All RF measurements (inc spectrum monitor)

will be available in both instruments• Measurements (if selected) will trigger and

run automatically on the instrument to which the device is currently connected

Throughput and IP counters• Run and record independent Throughput

Monitor and IP counters on both instruments

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8960 VIPDec 2005


Two-Cell FW and HW requirements

• Both Instruments must have E6701EMust have same FW revision on both

instruments• If testing EGPRS, both instruments must

have E6704A (and necessary EGPRS HW)EGPRS throughput testing requires latest

HW or upgrade• Both instruments must be connected via

LAN, hub or crossover cableProtocol Logging and data transfers to

external servers will not be possible with a crossover cable

8960 VIPDec 2005


Phase & Amplitude vs. Time (PAvT) Measurement

16 August 2005Rev 5.1

Time

Pow

er

0 t0 t1 t2 t3 t4 t5 t6 t7 t9t8 t10

u0

u1

u2 u3

u4 u7 u9

u5

u6

u8

u10

TriggerLevel

p0

p4

p7p9

p1

p2

p5

p6

p8

p10

p3

User Provided

Agilent Returned

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8960 VIPDec 2005


Flexibility FeaturesSupports Variable Pulse Widths

Improves accuracyReduces measurement time

Supports User-Selectable Measurement IntervalsCan be offset from center of pulse widthAvoid edge transientsMultiple measurements on a single pulse

Supports Aperiodic Return to Reference LevelReduces measurement timeAllows user to optimize against LO instability

User Defines Computation of Final ResultsAllows user to optimize for their situation

8960 VIPDec 2005


Key PAvT Capabilities• Measurement Intervals

• Count – 512 max, 1 min• Width – 400 msec max, 100 usec min• Center – 400 msec max, 50 usec min

• Trigger• Threshold – 30 dB max, 0 dB min• Source – RF Rise, Immediate, External• Delay – 10 msec max, 0 sec min

• Dynamic Range - -20 dBm to +35 dBm• Reference Power must be within 3 dB of Expected Power• Operation is only available over remote user interface

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8960 VIPDec 2005


PAvT Availability

• PAvT will be implemented in the GSM/GPRS/EGPRS technologies –E1968A-101, 102, 103, 201, and 202

• Available as an option to the E1968A test application:E1968A-410

• Available as included feature of the E6701D/E lab applications• First commercial release will be end of Aug ‘05 (firmware download

available via web) on the E1968A• Available as a pre-release on the E6701D/E in Oct ‘05• Available on new factory shipped instruments as part of E1968A and

E6701D with final specs from Jan ’06• E5515C with 4.5 HW is required (please check with your local rep.)

Overview of W-CDMA Enhancements

E1963A W-CDMA Test Application with HSDPA• E6703C W-CDMA/ HSDPA Lab Application

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8960 VIPDec 2005


Summary of new HSDPA TA functionalitySource –QPSK and 16QAMFRC H-Sets 1 through 512.2k W-CDMA + HSDPA

Signaling –FDD Test Mode RB Test ModeFully functional MAC-hs• Ack, nAck, and CQI analysis

Measurements –HSDPA BLER• Ack/nAck count• statDTX count• BLER and Throughput• Median CQITransmitter tests• Channel Power• ACLR• SEM• DPOW• Flexible HSDPA triggering

8960 VIPDec 2005


3-slide summary of E6703C LA features – Slide 1

Connection types available:Or, HOW the 8960 and UE communicate

For Real-User testing:• Packet data (PS)• 3G.H324 Video conferencing• SMS/MMS• Circuit data (CS)• AMR Voice Echo

For RF and Signaling test:• Non-signaling FDD Test Mode• Radio Bearer Test Mode

Bearer types available:Or, WHAT the 8960 and UE communicate

• PS data Up to 384kbps• 3G.H324 64kbps UDI• SMS/MMS CS or PS domain• CS data Up to 57.6kbps• AMR Voice 4.75k to 12.2kFDD and RB test modes• W-CDMA RMC’s up to 384kbps• HSDPA FRC H-Sets 1 thru 5 New

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8960 VIPDec 2005


3-slide summary of E6703C LA features – Slide 2Core network environment• Frequency bands I thru VI• ARFCN hard handover• Variable closed loop power control• Authentication and Integrity Protection• In-box AWGN• OCNS for W-CDMA and HSDPA• Configurable MAC-hs parameters

Mobility emulation• 2nd cell soft handoff• Compressed mode• InterRAT handovers• Transport channel reconfigurations• Optional RF fading from digital IQ

Additional analysis features• PC-based protocol logging• UE measurement reports• Fully flexible Beta and Delta values• In-box Ping function• Calling party number• SIB 11 neighbor list construction

New

8960 VIPDec 2005


3-slide summary of E6703C LA features – Slide 3 RF measurements• Thermal power• Channel power• Adjacent channel leakage*• Waveform quality• Spectrum emission mask*• Occupied bandwidth• Code domain power*• IQ constellation*• Spectrum analysis*• Dynamic power analysis* • Frequency stability• Inner loop power*• PRACH Tx On/Off• Phase discontinuity*

More measurementsLoopback BER w/ confidenceBLER – loopback and Ack/nAckChange of TFCOut of Sync power signaling and triggerTx dynamic powerHSDPA BLER

* = graphics

Mobile HS-DPCCH response to FRC H-Set5 with ½ slot DPCH offset New

New

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8960 VIPDec 2005


Ordering Info :

E1963A Test ApplicationE1963A-401 Video TestE1963A-403 HSDPA Test ModesE6703C Lab ApplicationE6703CU-001 E1963A to E6703CE6703CU-002 E6703A to E6703CE6703CU-003 E6703B to E6703CE6720A-003 Annual Upgrade Contract

8960 VIPDec 2005


Overview of Wireless Test Manager (WTM)(If needed, please request from your local representative for mo(If needed, please request from your local representative for more detailed re detailed presentation slides).presentation slides).

Family of Windows© test

automation software products

useful for UE calibration,

regression test, final test, etc.

8960 Wireless Test Set

E1852B Bluetooth™ Test Set

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8960 VIPDec 2005


Agilent WTM Family *Microsoft® Visual Basic.NET® development platform

E6560C* cdma2000/ IS-95/AMPS N5880A* cdma2000/IS95/AMPS (enhanced**) -NEW

E6562C* W-CDMAN5882A* W-CDMA (enhanced**) -NEW

E6564A/U 1xEV-DO (discontinuing soon)E6564C* 1xEV-DO -NEWN5884C* 1xEV-DO (enhanced**) -NEW

E6566C* GSM/GPRS/EGPRSE6568C* GSM/GPRS/EGPRS/W-CDMA -NEW

E6569C* SUITE (cdma2000, IS-95, 1xEV-DO, GSM, GPRS, W-CDMA, TDMA, AMPS)E6571C* Run-time

N4019A Bluetooth™N4018A Bluetooth Run-Time License

Features include:

• ready-to-use tests• test plans• test sequencing

** “enhanced” includes:

• Fading support• WPA support• soft/softer handoff, etc

For Conformance Test and Network Simulation

Agilent / Anite PartnershipIn June 2003, Agilent and Anite

announced a partnership to collaborate on a series of products to improve

development cycles for mobile handsets. The first test solutions offered in

November 2003 were GSM, GPRS, EDGE.

We have developed a new solution that has extended this collaboration

into the W-CDMA and HSDPA spaces, providing full support for Release 5.0.

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8960 VIPDec 2005


Agilent-Anite Protocol Test, Conformance Test,and Network Simulation Functionality Summary

Shipping Nov 2003:(Anite GSM/GPRS/EGPRS SAT and SAS with Agilent 8960)

GSM, GPRS and EGPRS formats in the Agilent 8960 are incorporated into the Anite SAT Development and Conformance Test Solution and the Anite SAS Network Simulator

Shipping Jul 2005:(Anite W-CDMA/HSDPA test solution with Agilent 8960 and Anite BasebandProcessor)

Agilent 8960 with option 004, Digital Bus, is used with Anite W-CDMA/HSDPA hardware and software to provide an integrated test solution

Shipping Feb 2005:Application-enabler testing offered by Anite using the 8960 test set

Application-enabler Conformance Test PlatformMMS & WAP application-enabler test as per OMA guidelinesExtension of the SAS network simulator

8960 VIPDec 2005


AMERICAS

Mario [email protected]

+81 45 849 2161

EUROPEDominic Rowles – EMEA Sales Manager

[email protected]+44 1252 775200

ASIA/PACIFIC

• Wansup Baek (Korea)•[email protected]

• Barry Yi (Taiwan)•[email protected]•+ 886 (0)2 2722 6890

• Mike Bradley – A/P Sales Manager•[email protected]•+ 86 10 8519 2190

e-mail – [email protected] - +44 1252 775200

Americas - +1 847 437 9010Japan - +81 45 849 2161

China - +86 10 8519 2190Taiwan - +886 (0)2 2722 6890

Vincent Caffrey – A/P Operations [email protected]

•+ 86 10 8519 2190

Scott Sullivan – Country [email protected]

+1 847 437 9010

JAPAN

Anite Contacts

20

8960 VIPDec 2005


On-Line Resources:

Agilent 8960 Home Page:

www.agilent.com/find/8960

Agilent Network in a Box Home Page:See the new Network in a Box videos!!

www.agilent.com/find/networkinabox

• On-line manuals, technical literature, latest revision downloads and much more!

8960 VIPDec 2005


On-Line Resources (continue !!) :GSM/GPRS/EGPRS Products Pagewww.agilent.com/find/e1968awww.agilent.com/find/e6701dwww.agilent.com/find/e6704a

W-CDMA/HSDPA Product Pagewww.agilent.com/find/e1963awww.agilent.com/find/e6703cwww.agilent.com/find/hsdpa

1xEV-DO Product Pagewww.agilent.com/find/e6706aCDMA2000 Product Pagewww.agilent.com/find/e6702b

Baseband Studio Product Pagewww.agilent.com/find/basebandstudioWireless Test Managers Product Pagewww.agilent.com/find/wtmanagers

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Thank you for your time

8960 VIPDec 2005


Q and A

E1963A Programming Training Rev 09/13/01

1000xxxx-E1963A_PU2.ppt 1

Programming TrainingE1963A W-CDMA Test Application

2

Intended Audience

• Understand W-CDMA technology and UE test.• Proficient in at least one programming language.• Helpful: Have completed 8960 programming training.



3

Objectives

• Learn how to program the E1963A W-CDMA TA• Key programming steps• GPIB commands

4

Agenda

• Programming Flowchart Review• Programming Flowchart Details



5

Programming Flowchart ReviewStep 1

Set up the test set.

Step 2Configure test set and mobile station parameters.

Step 3Set measurement parameters.

Step 4Make a connection.

Step 5INITiate and FETCh measurements.

Step 6Reconfigure test set and mobile station

connection parameters.

Step 7End the connection.

Test new conditions?

Yes

No

6

Step 1: Set Up the Test Set• Initialize the Test Set

• *CLS• *RST

• Turn Debugger On (turn this off after code is complete)• SYST:COMM:GPIB:DEB ON

• Set Operating Mode• CALL:OPER:MODE CALL

• Set Amplitude Offsets• SYST:CORR:FREQ <>

• Freeze the front panel display (do this after code is complete)• DISP:MODE FAST

Example 1



7

Step 2: Configure Test Set andMobile Station Parameters• Set Up The Cell Parameters

• Set cell parameters like the MCC, MNC, and LAC • Specify whether single or repeat paging should be used when paging

the UE.

8

Programming ConceptsImportant 8960 Cell Parameters Setting

BCCH Update Page:

“Auto”--- When you change a parameter that causes a BCCH Update, the test set updates its BCCH information and sends a Paging Type I message to the UE telling it to re-read the BCCH.

“Inhibit”---When you change a parameter that causes a BCCH Update, the test set updates its BCCH information but does NOT send a Paging Type I message to the UE.If your UE does not support the BCCH Update procedure, set this field to Inhibit.

CALL:BCCH:UPDA



9


ATT Flag State(IMSI Attach Flag) in BCCH:

“Set”--- After UE camps a network, UE will always register and update IMEI/IMSI via location update procedure.

“Not Set” --- After UE camps a network, UE will only register when it determines that it has camped an a new cell, UE uses the MNC,MCC and LAC to determine if the cell is new

CALL:ATTFlag[:STATe]

10


Uplink Parameters>Maximum Uplink Transmit Power Level:

Power Class 1: 33 dB is default setting

Power Class 3: 24 dB, Qualcomm UE

Power Class 4: 21 dB, Nokia UE

Note: Must set up this parameter correctly with the UE you want to test before set up call connection, otherwise UE can not pass open loop power and Transmit On/Off Power measurement



11

OR

Step 2: Configure Test Set andMobile Station Parameters

Set DOWNLINK Parameters:• CALL:POW <>

• CALL:CHAN <>• CALL:CONT:DOWN:FREQ:AUTO OFF

CALL:RFG:FREQ <>

• CALL:SCOD <>

⇒Sets downlink power (cell power)

⇒Sets downlink channel⇒Sets downlink frequency control to

manual and then sets downlink frequency

⇒Sets downlink primary scrambling code

12


Set DOWNLINK Parameters:• CALL:DPCH:TYP RMC12• CALL:DTCH:DATA <>

<PRBS15, PRBS9, ZER, ONES>• CALL:DPCH:RMC12:CCOD <>• CALL:DPCH <>• CALL:CPIC <>• CALL:CCPC:PRIM <>

⇒Sets downlink DPCH type to 12.2k RMC⇒Sets downlink DPCH data type⇒Data type options⇒Sets downlink DPCH channelization code⇒Sets downlink DPCH power level⇒Sets CPICH power level⇒Sets P-CCPCH power level



13

Step 2: Configure Test Set andMobile Station ParametersSet DOWNLINK Parameters:• CALL:PICH:CCOD <>• CALL:PICH <>

• CALL:AWGN:POW:AMPL <>

⇒Sets PICH channelization code⇒Sets PICH power level

⇒Sets AWGN power level

14


SET UPLINK Parameters:• CALL:MS:POW:TARG <>

• RFAN:CONT:POW:AUTO OFFRFAN:MAN:POW:FDD <>

• CALL:FDDT:CLPC:UPL:MODE <>

<ACT,UDOW, UP, DOWN, UDOW10>

⇒Sets MS Target Power and expected power.

⇒Sets RF analyzer expected power control to manual and then sets expected uplink power

⇒Sets which closed loop power control bits to send to UE on downlink DPCCH

⇒Bit sequence options

OR



15

OR

Step 2: Configure Test Set andMobile Station ParametersSET UPLINK Parameters:

• CALL:UPL:CHAN <>• RFAN:CONT:UPL:FREQ:AUTO OFF

RFAN:MAN:UPL:FREQ <>

• RFAN:CONT:MEAS:FREQ:AUTO OFFRFAN:MAN:MEAS:FREQ <>

• CALL:UPL:DPCH:SCOD <>

⇒Sets expected uplink channel⇒Sets RF analyzer uplink frequency

control to manual and then sets expected uplink frequency

⇒Sets RF analyzer measurement frequency control to manual and then sets measurement frequency

⇒Sets expected uplink primary scrambling code

Example 2

16

Step 3: Set Measurement Parameters

• SET:CONT:OFF ⇒Sets triggering for all measurements to single



17

Step 3: Set Measurement Parameters -Thermal Power• SET:WTP:TIM <>• SET:WTP:COUN <>

⇒Sets measurement timeout time⇒Sets measurement count

18

Step 3: Set Measurement Parameters -Channel Power

• SET:WCP:TIM <>• SET:WCP:COUN <>• SET:WCP:TRIG:SOUR <>

<IMM, PROT, RISE, AUTO>• SET:WCP:TRIG:DEL <>

• SET:WCP:INT:TIME <>

⇒Sets measurement timeout time⇒Sets measurement count⇒Sets trigger source⇒Trigger source options⇒Sets trigger delay

⇒Sets measurement interval



19

Step 3: Set Measurement Parameters -Waveform Quality

• SET:WWQ:TIM <>• SET:WWQ:COUN <>

• SET:WWQ:TSL <>

⇒Sets measurement timeout time⇒Sets measurement count

⇒Selects which timeslot to measure

20

Step 3: Set Measurement Parameters -Adjacent Channel Leakage Ratio (ACLR)• SET:WACL:TIM <>• SET:WACL:COUN <>• SET:WACL:TRIG:SOUR <>

<IMM, PROT, AUTO>• SET:WACL:TRIG:DEL <>

• SET:WACL:LOW:STAT <>• SET:WACL:LOW2:STAT <>• SET:WACL:UPP:STAT <>• SET:WACL:UPP2:STAT <>

⇒Sets measurement timeout time⇒Sets measurement count⇒Sets trigger source⇒Trigger source options⇒Sets trigger delay

⇒Turns measurement off/on for various offsets



21

Step 3: Set Measurement Parameters -Loopback Bit Error Ratio (BER)• SET:WBER:TIM <>• SET:WBER:COUN <>

⇒Sets measurement timeout time⇒Sets number of bits to test

Example 3

22

Step 4: Make a Connection

• Include “PAUSE” in program to wait for UE to get configured and begin transmitting in FDD mode.

• With no signaling from 8960, UE must begin transmitting uplink DPCH (12.2k RMC).

• At proper power level, frequency, and primary scrambling code.• Synchronized to the 8960 for Waveform Quality.• Loopback Mode 1 for BER.

• 8960 scans for and automatically detects the uplink signal.

Example 4



23

Step 5: INITiate and FETCh Measurements

INITiate Measurements

Meas Name

NONE

WAITINIT:DONE?

≠ 0

Integrity Indicator

ContinueProgram

Invoke ErrorHandler

0FETChMeasurement

INIT:WBER;WTP;WWQ;WACL

FETC:WTP

Example 5

24

Programming ConceptsConcurrent Measurements•Transmitter and Receiver Tests can be made concurrently

•Results are available as soon as possible

INIT:WACL;WTP;WWQINIT:DONE?

•Implementation



25

Programming ConceptsIntegrity Indicators of Measurements•Test Set evaluate conditions surrounding a measurement

•Equals 0 if conditions are normal

•Recommended use:Check value

IF

Programproceeds

Equal to 0

Program must determine action

Not Equal to 0

26

Step 6: Reconfigure Test Set andMobile Station Connection Parameters• Reconfigure the Connection when using Active Cell

• Physical Channel Reconfig• CALL:SET:CHAN:DOWN <>• CALL:SET:CHAN:UPL:CHAN <>OR• CALL:SET:CHAN:UPL:CONT:AUTO• CALL:SET:CHAN:UPL:SEP <>

CALL:HAND:PCR ! Executes the handoff

• Transport Channel Reconfig• CALL:SETup:TCReconfig:RBTest:RAB <><RMC12,RMC64,RMC144,RMC384,RMC33NC>

CALL:HAND:TCR ! Executes the handoff

• System Handoff• CALL:SET:SYST:GSM:ALER [ON|OFF]

CALL:SET:SYST:[FDD|GSM] ! Executes the handoff

Example6-1

Example6-2



27

Step 7: End the Connection

• End UE transmission.• SYST:PRES3 ⇒Partially presets the 8960 in preparation for testing

next UE. Does not reset parameters to defaults.

28

Review Questions

• Question 1: What are two things that can be done to improve program execution speed once code development is complete?

• Question 2: How can you determine if a measurement result is valid?

Mobile Phone Calibration Concept

1

Page 1

Mobile Calibration and Multiple-Devices Testing Concept

Agilent TechnologiesJanuary 16-18, 2006

Page 2

Agenda

•Introduction to Mobile Phone Calibration

•Equipment and Phone Requirements

•Typical Calibration Procedures

•Multiple Devices Testing Concept

•Q & A


2

Page 3

Board Test/Mobile Adjustment Final Test ShipPhone

AssemblyBoard

AssemblySMT

Visual Inspection/Keypad testing

•Essential part of Manufacturing•Performed at Board Level•Automated

Introduction to Mobile Phone Calibration: Typical Line Layout

Page 4

Introduction to Mobile Phone Calibration: Why Calibrate?Meet Specifications Exactly

Ensure Data Quality

Share Network Resources

Conserve Battery Power


3

Page 5

Speech & Chan

Coders

Modulator & ChannelSynthesizer

PAD

up

lexer

Antenna

BatteryKeypad &Display

Mobile PhoneSubscriber

Down-converter &Demodulator

LNA

Micro-controller / EEPROMS

I/QFreq TXPower

RXPower

BatteryIndicator

Intro to Mobile Phone Calibration:What Needs Adjustment?

Page 6

RS-232 / USB

Equipment and Phone Requirements:The Test BusLevel-shifted RS-232 Protocol or USB

Proprietary Command Set

In CALIBRATION:• Test Mode Setup• Continuous Transmit• Query Received Level• Program Calibration FactorsIn FINAL TEST:• Keypad Emulation• Audio Loopback• Set/Query Serial Number• Establish a Call


4

Page 7

8960 Wireless Comm. Test Set

RS-232 Port or USB Interface

PC Controller

Digital I/O, Fixture Control

Power Supplies

RF Isolated Fixture

Equipment and Phone Requirements:Test Equipment Needs

Page 8

ONE SHOT ITERATIVE

Typical Calibration Procedures:Two Types of Calibration

Measure

Program Correction Factor

Verify

DONE!

Typically used for receiver, frequency or battery calibration

Measure

Program Correction Factor

Re-Measure

Check against limits

Loop until within limits or timeout

DONE!

Typically used for modulator or power amplifiers


5

Page 9

Typical Calibration Procedures:Two Stages of CalibrationPre-Production Calibration

Usually take very long timeGood uniformity between PCBsUsually need to be done if key component changed

Production Calibration

RF Related CalibrationCalibrate on production line with RF Test SetMay vary a lot between PCBs

Non-RF Related CalibrationSometimes calibrate on different Test BayMay reduce the RF Test Set using time if calibrate on the same Test Bay

Page 10

I/Q Modulator Adjustment

Chan Center 0’s1’s

Spurs

Typical Calibration Procedures:Measurements

Use an RF Test Set, Spectrum Analyzer, or Vector Signal Analyzer

Example: Transmit Continuous 1’s and Adjust Spectrum Spurs. Repeat with Continuous 0’s.

Calibration Time can be Quite Long!!

Usually I/Q Adjustment is Designed Out


6

Page 11

Frequency Correction


Use RF Test Set or Universal Counter

Important for Precise Timing and Channel Synthesizing

Measure Absolute Frequency, or Modulation Frequency Error

One-shot or Iterative

8-bitDAC

TCXO(VCO)

Freq Error

DAC Input

Page 12

Typical Calibration Procedures:Measurements Example – VCTCXO Curve Fitting

Looking for zero error pointLooking for zero error point


7

Page 13

Transmit Power


Use 8960 RF Test Set or Power Meter & Power Sensor• Measure Power Ramp Values• Correct for Well-Shaped Power Burst• Measure All Power Levels and Many Channels• Variations: Average Burst Power Only, or Fewer Levels & Channels

Page 14

Receive Power


Both GSM and CDMA

RF Test Set (or Signal Generator) Transmits Various Power Levels and Frequencies to Phone

Phone Reports Received Level on Test Bus

Example: RxLevel = Receiver DAC Value – AGC Gain + RxOffset


8

Page 15

Typical Calibration Procedures:Measurements Example – Transmit Power Curve

Low Power part

High Power partPiecewise-Linear

Page 16

Other Considerations


Battery Indicator: Power Supply Sources a Range of Voltages. Phone Reports Indicator Level

A/D Converters: DC Voltage Measurements

After All Adjustments: Write Calibration After All Adjustments: Write Calibration Values to memory over Test BusValues to memory over Test Bus


9

Page 17

Modular Code, Callable from Many Environments (C is a good choice)Use any COM PortR&D Usually Delivers to Manufacturing - but Not Always!

Test Tips and Tricks:Test BusWrite a Phone Communication Driver - Example Functions:• phoneTestMode();

• phoneContinuousTransmit(int channel, int power);

• phoneQuerySerialNumber(char *serialNumber);

Page 18

long CalibrateRXLevel(double baseStationLevel){

long phoneReceiveLevel;long correctionFactor;int num_tries = 0;

// First, configure the Base Station to the right levelhp8922_confRFGLevel(baseStationLevel);// Wait for the phone to settleSleep(100);// fetch RX report from Test BusPhoneQueryRXLevel (&phoneReceiveLevel);

// Calibrate if out of limits.while((phoneReceiveLevel < lowLimit) || (phoneReceiveLevel > highLimit)){

// Quit if too many attempts.if(num_tries = 10)

return PHONE_NOT_CALIBRATED;correctionFactor = CalculateRXCorrectionFactor (phoneReceiveLevel);PhoneProgramRXCorrectionFactor (correctionFactor)// Another reading after correction is made.PhoneQueryRXLevel (&phoneReceiveLevel);num_tries++;

}

return PHONE_CALIBRATED;}

Test Tips and Tricks:Calibration Code Example (Iterative)


10

Page 19

Test Tips and Tricks:Choosing Correction FactorsMost Difficult Part of Calibration!Most Difficult Part of Calibration!

correctionFactor = CalculateRXCorrectionFactor (phoneReceiveLevel);

•Check for Maximum Attempts or Timeout

•Remember Previous Attempts

•Do not Repeat, and Fail if Oscillating

•May not be Linear! Try Curve Fitting

•Know the Shape of Correction Factors vs. Measurements

Page 20

Test Tips and Tricks:Curve Fitting and Interpolation

Calibration Factors(DAC Values)

PowerMeasurement

•Measure power for many calibration factors, on one channel & power level.

•Store table of calibration factors & slopes

•Use this table for interpolation on every other channel & power level.

Example: Transmit Power Calibration


11

Page 21

How Can Manufacturing Shorten the Time?Experiment with Good and Bad PhonesAdd Intelligence to Iterative Procedures - Curve Fitting / Interpolation / LearningKnow your RF Path LossesGive Feedback to R&D

Test Tips and Tricks:Calibration TimePhone Design Chooses:• Overall Calibration Algorithms• Number of Test Points

Page 22

Tester Architecture

Mobile Phone Test PlatformPhone Calibration

Algorithms

Phone Test Plans

Phone Communication

Phone CommandsCustomer Unique

MeasurementsPCTest ExecutiveIntegrationTest Head

Chipset Unique


12

Page 23

Summary

Calibration/Adjustment of Phone is Essential in Manufacturing

Algorithms and Test Points Vary Due to Phone Design

You Can Quickly Produce Quality Phones:• Use the Right Equipment• Keep Code Maintenance in Mind• Experiment with Correction Factors and

Algorithms

Page 24

Multiple Devices Testing ConceptOne-Up with Multiple Devices!•Switching test solution

•Test multiple devices sequentially

•Using single set of test equipments but multiple fixtures

•One PC controlled by one operator

•ONE Software Instances

•Load/Unload time saved


13

Page 25

Multiple Devices Testing ConceptOne-Up with Multiple Devices!

。。。

UUT1

UUT2

Switching system will test two UUTs in parallel to improve major RF box efficiency:。。。

。。。

Typical test system tests each UUT in sequence

。。。

。。。

。。。

UUT1

Use instrument sharing technology to improve asset utilization and reduce cost.

RF Test Time

Non-RF Test Time

Operator Loading Time

DescriptionLegend

Page 26

Multiple Devices Testing ConceptOne-Up with Multiple Devices!Possible Issues

•Error handling

•Switching for RF is easy but how about DC Power and Control Interfaces (RS-232 & USB)

•RF Calibration

•Need special defined SOP


14

Page 27

Multiple Devices Testing ConceptMulti-Up with Multiple Devices!•Test multiple devices simultaneously

•Using multiple sets of test equipments and fixtures

•One PC controlled by one operator

•ONE or TWO Software Instances and parallel testing

•Higher throughput per floor area

•Can further combine switching test solution

Page 28

Multiple Devices Testing ConceptSystem Architecture

Agilent 66321B Power Supply

Agilent 66321B Power Supply

Agilent 8960GSM Test set

Agilent 8960GSM Test set

Level Converter

Level Converter

HP-IB

I(H

P-IB II) Power Line

Power Line

RF Signal

RF Signal

RS-232C

RS-232C

Shield Box

Shield Box

PC

Test System Test Fixture


15

Page 29

Multiple Devices Testing ConceptMulti-Up with Multiple Devices!Possible Issues

•RACING condition

•Interface sharing. E.g. GPIB interface

•Interface Bus resource issue

•May need advanced software programming skills like Multi-Thread Programming

Page 30

Agilent TestExec SL PlatformSupport both Multiple Devices Testing Concept


16

Page 31

Agilent TestExec SL PlatformSupport both Multiple Devices Testing Concept

Page 32

Agilent Wireless Test Manager PlatformSupport both Multiple Devices Testing Concept


17

Page 33

Agilent Wireless Test Manager PlatformSupport both Multiple Devices Testing Concept

Page 34

SummaryMultiple Devices Testing •May enhance test efficiency

•May enhance test throughput

Lower Cost of TestLower Cost of Test

•May increase maintenance difficulties

•May need advanced test platform or better programming skills

Trade Off !!Trade Off !!

1

Phase & Amplitude vs Time Measurement

Agilent Confidential Page 2

GSM/EDGE

GSM EDGEModulation GMSK 3PI/8 8PSK

Bits/Symbol 1 3

Data Bits per Burst 114 342

Symbol Rate 270.833k 270.833k

Filter 0.3 Gaussian Linearized Gaussian

2


EDGE vs GSM Vector (Constellation) Diagrams


Power Amplifier Characterization

The Phase & Amplitude vs Time measurement provides a means to characterize the phase and magnitude errors introduced by the non-linearity of power amplifiers operating over a wide dynamic range. By measuring the errors in phase, amplitude and frequency as a function of output level it is possible to pre-distort the input signal to the power amplifier to create a more accurate output signal.

Bias

Fixed input level, vary frequency

Characterize gain and phase vs bias and frequency

3


Characterization SolutionsBias

IN OUT

Network Analyzer OUT/IN

Classic Solution

LO

UE…. 8960 Wireless Test Set

Measurement Subsystem

8960-based Solution


8960 Wireless Test Set Phase & Amplitude vsTime Measurement Solution• Agilent has taken a very flexible approach to the Phase & Amplitude

vs Time Measurement• Agilent’s solution provides the user with either :

• Raw magnitude/phase waveform samples, or• Flexible measurement to provide high accuracy amplitude, phase

and frequency information over wide dynamic range

4


Flexibility FeaturesSupports Variable Pulse Widths

Improves accuracyReduces measurement time

Supports User-Selectable Measurement IntervalsCan be offset from center of pulse widthAvoid edge transientsMultiple measurements on a single pulse

Supports Aperiodic Return to Reference LevelReduces measurement timeAllows user to optimize against LO instability

User Defines Computation of Final ResultsAllows user to optimize for their situation


Flexible Phase & Amplitude vs Time Measurement

User Provides:• Power Level of Largest Pulse in

Sequence• Expected Frequency• Trigger Level• Temporal location of center of

the measurement interval in each pulse to be analyzed

• Measurement interval within each pulse to be analyzed

Time

Pow

er

0 t0 t1 t2 t3 t4 t5 t6 t7 t9t8 t10

u0

u1

u2 u3

u4 u7 u9

u5

u6

u8

u10

TriggerLevel

p0

p4

p7p9

p1

p2

p5

p6

p8

p10

p3

User Provided

Agilent ReturnedProvided by Handset DeveloperData Returned by Agilent 8960

Test waveform returns to reference level to mitigate instabilities in the UE local oscillator.User selects measurement duration and center to improve accuracy and avoid transients at pulse edges.

5


Measuring the Waveform

ti tjui ujti,j =center of

measurement intervals (not

pulse centered)

ui,j =width of

measurement intervals (vary due

to pulse level)

j does not need to be sequential to i


Time

Phas

e

0t0 t1 t2 t3 t4 t5 t6 t7 t9t8 t10

a4

a7

a10

a1

a2

a5

a6a8

a9

a3

d1,0

d2,0

d3,4d5,4

d6,7 d8,7

d10,9

w9

w7

w4

w0

( ), 360n r n r r n rd a a F t t= − + −⎡ ⎤⎣ ⎦

Customer Provided

Agilent Returned

Customer Calculated

Flexible Phase & Amplitude vs Time MeasurementExample of User Computation of UE Phase Shift vs Level

Results Returned for Initial ‘Reference’Pulse (first measurement requested):• Power, estimated power of pulse in dBm• Phase, of pulse at specific time in

degrees (0 deg for initial pulse)• Frequency, delta frequency from

expected input frequency

Results Returned for Each Pulse (after initial ‘Reference’ pulse):

• Power, delta power of pulse from 1st

reference pulse (dB)• Phase, delta phase of pulse from 1st

reference pulse (degrees)• Frequency, delta frequency from delta

frequency of 1st reference pulse (Hz)

Use multiple reference pulses to compute UE phase shift using interpolation ( e.g. Quadratic, Spline)

Provided by Handset DeveloperData Returned by Agilent 8960Data calculated by user

Extrapolation

6


Key PAvT Capability• Measurement Intervals

• Count – 512 max, 1 min• Width – 400 msec max, 100 usec min• Center – 400 msec max, 50 usec min

• Trigger• Threshold – 30 dB max, 0 dB min• Source – RF Rise, Immediate, External• Delay – 10 msec max, 0 sec min

• Dynamic Range - -20 dBm to +35 dBm• Reference Power must be within 3 dB of Expected Power• Operation is only available over remote user interface

www.agilent.com.tw

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www.agilent.com.tw/find/handouts

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©2005台灣安捷倫科技股份有限公司Issued date : 01/2006Updated data : 01/2006Printed in Taiwan 01/2006

中文版：5989-4582ZHA

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